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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NS, IN (Joint) |
2017-03-03 13:20 |
Okinawa | OKINAWA ZANPAMISAKI ROYAL HOTEL | On Path Selection Considering Length and Reliability for Automatic Evacuation Guiding Based on Interactions between Evacuees and Their Mobile Nodes Takanori Hara, Masahiro Sasabe, Shoji Kasahara (NAIST)  NS2016-247 |
When disasters occur, evacuees have to evacuate to safe place quickly. To tackle this problem, there has been proposed a... [more] | NS2016-247 pp.517-522 |
| PRMU, IPSJ-CVIM, MVE [detail] | 2017-01-19 18:35 |
Kyoto | Reliability Evaluation of R-R Interval Measurement Status using the Electric Potential Characteristics of QRS Complex for Wearable ECG Devices Kana Eguchi, Ryosuke Aoki, Kazuhiro Yoshida, Tomohiro Yamada (NTT) PRMU2016-140 MVE2016-31 |
Electrocardiogram (ECG) captured by wearable ECG devices easily contains artifact because of the measurement faults. Sin... [more] | PRMU2016-140 MVE2016-31 pp.171-176 |
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| R | 2016-12-16 15:55 |
Kanagawa | Maholoba Minds Miura (Miura City, Kanagawa Prefecture) | A Quantitative Study on Bug-fixing Process in Open Source Software Takahiro Ushiroda (Hiroshima Univ.), Yasuhiro Saito (JCGA), Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2016-57 |
Open-source software (OSS) is computer software with its source code made available with a license in which the copyri... [more] |
R2016-57 pp.19-24 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:30 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46 |
We propose a circuit analysis method using the bimodal RTN (random telegraph noise) model of the defect-centric distri... [more] |
VLD2016-52 DC2016-46 pp.49-54 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 09:45 |
Osaka | Central Electric Club | [Invited Talk]
A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application Yuhei Yoshimoto, Yoshikazu Katoh, Satoru Ogasahara, Zhiqiang Wei, Kazuyuki Kouno (Panasonic Semiconductor Solutions Co., Ltd.) SDM2016-61 ICD2016-29 |
This paper presents a secure application—a physically unclonable function (PUF)—that uses the physical prope... [more] | SDM2016-61 ICD2016-29 pp.89-94 |
| R | 2016-07-29 13:30 |
Hokkaido | Otaru Chamber of Commerce and Industry | On Optimal Software Release Problems Based on a Hazard Rate Model with Effect of Change-Point Shinji Inoue, Shigeru Yamada (Tottori Univ.) R2016-13 |
We often observed the case that the hazard rate of software failure-occurrence time intervals notably change in actual t... [more] | R2016-13 pp.1-6 |
| R | 2016-05-28 15:40 |
Aichi | WINC AICHI | On Binomial-Type Software Reliability Modeling with Test Environment Factors Shinji Inoue, Shigeru Yamada (Tottori Univ.) R2016-7 |
Considering an actual software testing phase, we have no doubt that the software reliability growth process depends on t... [more] | R2016-7 pp.39-44 |
| ICD | 2016-04-14 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Lecture]
ReRAM reliability characterization and improvement by machine learning Tomoko Ogura Iwasaki, Sheyang Ning, Hiroki Yamazawa, Chao Sun, Shuhei Tanakamaru, Ken Takeuchi (Chuo Univ.) ICD2016-8 |
The low voltage and fast program capability of ReRAM is very attractive for next-generation memory applications, but the... [more] | ICD2016-8 pp.39-44 |
| VLD | 2016-02-29 13:55 |
Okinawa | Okinawa Seinen Kaikan | Random Testing of C Compilers Based on Test Program Generation by Equivalence Transformation Kazuhiro Nakamura, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2015-112 |
This article proposes a method of generating test programs for random testing of C compilers based on equivalence transf... [more] | VLD2015-112 pp.7-12 |
| SDM | 2016-01-22 10:05 |
Tokyo | Sanjo Conference Hall, The University of Tokyo | [Invited Talk]
Reliability Results of 4 million Micro Bump Interconnections of 3D Stacked 16 M Pixel Image Sensor Yoshiaki Takemoto, Naohiro Takazawa, Mitsuhiro Tsukimura, Haruhisa Saito, Toru Kondo, Hideki Kato, Jun Aoki, Kenji Kobayashi, Shunsuke Suzuki, Yuichi Gomi, Seisuke Matsuda, Yoshitaka Tadaki (Olympus) SDM2015-108 |
We evaluated the reliability of 3D stacked CMOS image sensors (CISs) with 4 million micro bump inter-connections at a 7.... [more] | SDM2015-108 pp.1-4 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-03 10:50 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | [Invited Talk]
Development of Via Structures in IC Package Substrates for Impedance Reduction Tomoyuki Akaboshi, Taiga Fukumori, Daisuke Mizutani, Motoaki Tani (Fujitsu Lab.) CPM2015-136 ICD2015-61 |
This paper describes the impedance reduction technologies in build-up package substrates for high performance CPU, such ... [more] | CPM2015-136 ICD2015-61 pp.51-54 |
| R | 2015-07-31 16:35 |
Aomori | Latest trends of JIS reliability design and analysis terminology
-- Comparison with JIS Z 8115 amendment drafts and IEC 60050-192 first edition -- Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor), Fumiaki Harada (FXAT) R2015-21 |
Dependability (reliability) terms of IEC 60050-192 standard was enacted in February 2015. It has passed 25 years since t... [more] | R2015-21 pp.43-48 |
|
| R | 2015-06-19 14:50 |
Tokyo | A Study of Short-time Evaluation Method for Aluminum Electrolytic Capacitor Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba) R2015-13 |
By using quality engineering, we developed a technique to evaluate aluminum electrolytic capacitor in a shorter time tha... [more] | R2015-13 pp.19-24 |
|
| RECONF, CPSY, VLD, IPSJ-SLDM [detail] | 2015-01-30 14:20 |
Kanagawa | Hiyoshi Campus, Keio University | Reliability Management in 2-layered Supervisor Processor Daiki Yamamoto, Morihiro Kuga, Motoki Amagasaki, Masahiro Iida, Toshinori Sueyoshi (Kumamoto Univ) VLD2014-144 CPSY2014-153 RECONF2014-77 |
Computer systems are not only used in consumer electronics such as mobile phones and televisions but various industria... [more] | VLD2014-144 CPSY2014-153 RECONF2014-77 pp.199-204 |
| R | 2014-11-20 15:10 |
Osaka | The study about acceleration model of ceramic capacitors by voltage stress Toshinari Matsuoka (MELCO) R2014-62 |
The maximum likelihood estimation is applied for acceleration modeling. The effectiveness of this method becomes clear i... [more] | R2014-62 pp.7-14 |
|
| R | 2014-11-20 15:35 |
Osaka | Problem of Repeatability about Dew Test and Evaluation Method by Micro Dew Condensation Test Mayuko Nishihara, Kazuhiro Hayashinuma (Murata.Co) R2014-63 |
Dew Cyclic test is one of most famous evaluation methods for Electro Chemical Migration (ECM). But this test is a proble... [more] | R2014-63 pp.15-19 |
|
| SS | 2014-10-23 15:15 |
Kochi | Kochi city culture-plaza cul-port | Predicting Number of Faults Based on Software Reliability Growth Model from Repository System Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) SS2014-27 |
Software development requires repository system to manage the whole developing phases such as coding and testing. We a... [more] |
SS2014-27 pp.13-16 |
| R | 2014-08-01 13:30 |
Hokkaido | Smile Hotel Hakodate | Hazard Rate Modeling for Software Reliability Assessment with Multiple Change-Point Shinji Inoue, Shigeru Yamada (Tottori Univ.) R2014-14 |
This paper discusses software hazard rate modeling with the effect of multiple change-point occurrences for developing m... [more] | R2014-14 pp.1-6 |
| DC | 2014-06-20 15:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Fault Tolerant Response Analyzer for Built-in Self-test Yuki Fukazawa (Mie Univ.), Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2014-14 |
Reliable built-in self-test (Reliable BIST) is a scheme in which embedded BIST circuits are designed to be tolerant of t... [more] | DC2014-14 pp.27-32 |
| R | 2014-05-23 16:20 |
Aichi | On Change-Point Modeling for Software Reliability Assessment with the Truncated Distribution of Initial Fault Content Shinji Inoue, Shigeru Yamada (Tottori Univ.) R2014-7 |
We discuss change-point modeling for software reliability assessment with the change of testing-environment. Especially,... [more] | R2014-7 pp.35-40 |
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