IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 28  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2023-10-13
15:10
Miyagi Niche, Tohoku Univ. [Invited Talk] statistical analysis of random telegraphic noise dependence on operating condition using electrical characteristic measurement platform
Takezo Mawaki, Rihito Kuroda (Tohoku Univ.) SDM2023-57
We refer to the overall measurement system composed of array test circuits and other equipment as the electrical charact... [more] SDM2023-57
pp.21-26
SRW, SeMI, CNR
(Joint)
2021-11-25
13:50
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
An Analysis of Acceptance Factors of Partner Robot -- What is "Animal-Like" --
Koki Saito, Yuki Furuya, Kazunori Takashio (Keio Univ.) CNR2021-9
In this study, we analyzed what kind of animal-like qualities are important in the acceptance of partner robots in house... [more] CNR2021-9
pp.11-15
SDM 2020-10-22
15:50
Online Online Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis
Ryo Akimoto, Rihito Kuroda (Tohoku Univ.), Akinobu Teramoto (Hiroshima Univ.), Takezo Mawaki, Shinya Ichino, Tomoyuki Suwa, Shigetoshi Sugawa (Tohoku Univ.) SDM2020-21
In this work, temporal noise characteristics of 11520 MOSFETs were measured for each of rectangular and trapezoidal shap... [more] SDM2020-21
pp.34-39
CS, IN, NS, NV
(Joint)
2020-09-11
11:15
Online Online A Mechanism for Simplifying VNF Implementation for Privacy Protection and Efficient Data Transfer Using SmartNIC
Ryuta Kremer, Takao Kondo, Daisuke Settai, Fumio Teraoka (Keio Univ.) NS2020-44
Network Function Virtualization (NFV) decouples Network Functions (NFs) from dedicated hardware and realizes their flexi... [more] NS2020-44
pp.15-20
SWIM 2020-02-21
17:15
Tokyo Kikai-Shinko-Kaikan Bldg. AI-based modelling of business model
Hiroshi Hatakama (Bunkyo Univ.) SWIM2019-33
Business model canvas is used worldwide for understanding and designing business models. However, systematic simulation ... [more] SWIM2019-33
pp.55-58
HCGSYMPO
(2nd)
2019-12-11
- 2019-12-13
Hiroshima Hiroshima-ken Joho Plaza (Hiroshima) Eye gaze analysis on aided conversations with an individual with aphasia
Tetsuya Hirotomi, Tomu Danura (Shimane Univ.), Mineko Booka (Pref. Univ. of Hiroshima)
Individuals with complex communication needs, including aphasic patients, often use communication aids, such as gestures... [more]
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
15:30
Osaka Ritsumeikan University, Osaka Ibaraki Campus Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more]
VLD2016-52 DC2016-46
pp.49-54
SDM 2016-10-27
10:50
Miyagi Niche, Tohoku Univ. Behavior of Random Telegraph Noise toward Bias Voltage Changing
Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shinya Ichino, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa (Tohoku Univ.) SDM2016-75
As the progression of MOSFETs scaling down continues, the impacts of RTN (Random Telegraph Noise) on the MOSFETs have be... [more] SDM2016-75
pp.35-38
MICT, ASN, MoNA
(Joint)
2016-01-28
14:15
Kanagawa Hotel Okada [Invited Talk] The key supports for developing new drugs and medical devices in Japan
Yutaka Natsumeda (KSLION) MICT2015-41
Although Japan is far behind USA or EU countries in developing new drugs and innovative medical devices, it would not be... [more] MICT2015-41
pp.13-16
TL 2015-12-13
12:00
Tokyo Room 303/304/305, Building #8, Waseda University Network of using Japanese -- A case study of the Nurse and Careworker Candidates from Indonesia Under the Economic Partnership Agreement --
Mamiko Kato (Waseda Univ.) TL2015-50
This paper reports on a qualitative study regarding nurse and careworker candidates from abroad living and working in Ja... [more] TL2015-50
pp.59-60
SDM, ICD 2015-08-25
09:30
Kumamoto Kumamoto City [Invited Talk] Low-Power Embedded ReRAM Technology for IoT Applications
Makoto Ueki, Akira Tanabe, Hiroshi Sunamura, Mitsuru Narihiro, Kazuya Uejima, Koji Masuzaki, Naoya Furutake, Akira Mitsuiki, Koichi Takeda, Takashi Hase, Yoshihiro Hayashi (Renesas Electronics) SDM2015-65 ICD2015-34
A low-power 2Mb ReRAM macro was developed in 90 nm CMOS platform, demonstrating lower power data-writing (x1/7-x1/10) an... [more] SDM2015-65 ICD2015-34
pp.41-46
SDM 2014-10-17
13:00
Miyagi Niche, Tohoku Univ. [Invited Talk] Analysis of Multi-Trap Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs
Toshiaki Tsuchiya (Shimane Univ.) SDM2014-92
We propose a novel method for analyzing random telegraph noise (RTN) by using charging history effects on the traps part... [more] SDM2014-92
pp.47-54
SDM 2013-11-15
15:00
Tokyo Kikai-Shinko-Kaikan Bldg. Impacts of Channel Doping on Random Telegraph Signal Noise and Successful Noise Suppression by Mobility Enhancement
Jiezhi Chen, Yusuke Higashi, Izumi Hirano, Yuichiro Mitani (Toshiba) SDM2013-114
In this work, impacts of channel doping concentration on single-trap and multiple-trap induced random telegraph signal (... [more] SDM2013-114
pp.83-86
SDM 2013-10-18
14:00
Miyagi Niche, Tohoku Univ. Study of Time Constant Analysis in Random Telegraph Noise at the Subthreshold Voltage Region
Akihiro Yonezawa, Akinobu Teramoto, Toshiki Obara, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2013-98
We extracted time constants of capture and emission of Random Telegraph Noise (RTN), and their dependencies of the gate-... [more] SDM2013-98
pp.51-56
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-26
16:00
Fukuoka Centennial Hall Kyushu University School of Medicine Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation
Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2012-70 DC2012-36
Designing reliable systems has become more difficult in recent years.
In this paper, statistical nature of RTN-induced ... [more]
VLD2012-70 DC2012-36
pp.63-68
SDM 2012-11-15
15:20
Tokyo Kikai-Shinko-Kaikan Bldg Neutral and Attractive Traps in Random Telegraph Signal Noise Phenomena using (100)- and (110)-Oriented CMOSFETs
Jiezhi Chen, Izumi Hirano, Kosuke Tatsumura, Yuichiro Mitani (Toshiba Corp) SDM2012-103
(To be available after the conference date) [more] SDM2012-103
pp.21-24
CNR 2012-06-25
15:45
Kanagawa Keio Univ. (Hiyoshi) Information support by robot partner using cloud service
Tang Dalai, Naoyuki Kubota (TMU) CNR2012-3
In previous work, we propose an information support system for elderly people based on sensor networks. However in order... [more] CNR2012-3
pp.11-16
SDM 2011-11-10
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Comprehensive Understanding of Random Telegraph Noise with Physics Based Simulation
Yusuke Higashi, Nobuyuki Momo, Hisayo S. Momose, Tatsuya Ohguro, Kazuya Matsuzawa (Toshiba) SDM2011-118
Physical modeling of transient and frequency domain noise simulation for random telegraph noise (RTN) is conducted, cons... [more] SDM2011-118
pp.17-20
SDM 2011-10-20
13:30
Miyagi Tohoku Univ. (Niche) [Invited Talk] Characteristics Variability and Random Telegraph Noise in Fully Depleted SOI MOSFETs
Toshiro Hiramoto (Univ. of Tokyo) SDM2011-97
Statistical characteristics of intrinsic channel fully depleted (FD) SOI MOSFETs and conventional bulk MOSFETs are compa... [more] SDM2011-97
pp.1-4
SDM 2011-10-20
14:20
Miyagi Tohoku Univ. (Niche) Reduction of Random Telegraph Noise with Broad Channel MOSFET
Hiroyoshi Suzuki, Rihito Kuroda, Akinobu Teramoto, Akihiro Yonezawa, Hiroaki Matsuoka, Taiki Nakazawa, Kenichi Abe, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2011-98
Drastic reduction of random telegraph noise (RTN) is demonstrated due to the broad channel MOSFET structure. We found th... [more] SDM2011-98
pp.5-9
 Results 1 - 20 of 28  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan