Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2023-10-13 15:10 |
Miyagi |
Niche, Tohoku Univ. |
[Invited Talk]
statistical analysis of random telegraphic noise dependence on operating condition using electrical characteristic measurement platform Takezo Mawaki, Rihito Kuroda (Tohoku Univ.) SDM2023-57 |
We refer to the overall measurement system composed of array test circuits and other equipment as the electrical charact... [more] |
SDM2023-57 pp.21-26 |
SRW, SeMI, CNR (Joint) |
2021-11-25 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
An Analysis of Acceptance Factors of Partner Robot
-- What is "Animal-Like" -- Koki Saito, Yuki Furuya, Kazunori Takashio (Keio Univ.) CNR2021-9 |
In this study, we analyzed what kind of animal-like qualities are important in the acceptance of partner robots in house... [more] |
CNR2021-9 pp.11-15 |
SDM |
2020-10-22 15:50 |
Online |
Online |
Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis Ryo Akimoto, Rihito Kuroda (Tohoku Univ.), Akinobu Teramoto (Hiroshima Univ.), Takezo Mawaki, Shinya Ichino, Tomoyuki Suwa, Shigetoshi Sugawa (Tohoku Univ.) SDM2020-21 |
In this work, temporal noise characteristics of 11520 MOSFETs were measured for each of rectangular and trapezoidal shap... [more] |
SDM2020-21 pp.34-39 |
CS, IN, NS, NV (Joint) |
2020-09-11 11:15 |
Online |
Online |
A Mechanism for Simplifying VNF Implementation for Privacy Protection and Efficient Data Transfer Using SmartNIC Ryuta Kremer, Takao Kondo, Daisuke Settai, Fumio Teraoka (Keio Univ.) NS2020-44 |
Network Function Virtualization (NFV) decouples Network Functions (NFs) from dedicated hardware and realizes their flexi... [more] |
NS2020-44 pp.15-20 |
SWIM |
2020-02-21 17:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
AI-based modelling of business model Hiroshi Hatakama (Bunkyo Univ.) SWIM2019-33 |
Business model canvas is used worldwide for understanding and designing business models. However, systematic simulation ... [more] |
SWIM2019-33 pp.55-58 |
HCGSYMPO (2nd) |
2019-12-11 - 2019-12-13 |
Hiroshima |
Hiroshima-ken Joho Plaza (Hiroshima) |
Eye gaze analysis on aided conversations with an individual with aphasia Tetsuya Hirotomi, Tomu Danura (Shimane Univ.), Mineko Booka (Pref. Univ. of Hiroshima) |
Individuals with complex communication needs, including aphasic patients, often use communication aids, such as gestures... [more] |
|
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-28 15:30 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46 |
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more] |
VLD2016-52 DC2016-46 pp.49-54 |
SDM |
2016-10-27 10:50 |
Miyagi |
Niche, Tohoku Univ. |
Behavior of Random Telegraph Noise toward Bias Voltage Changing Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shinya Ichino, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa (Tohoku Univ.) SDM2016-75 |
As the progression of MOSFETs scaling down continues, the impacts of RTN (Random Telegraph Noise) on the MOSFETs have be... [more] |
SDM2016-75 pp.35-38 |
MICT, ASN, MoNA (Joint) |
2016-01-28 14:15 |
Kanagawa |
Hotel Okada |
[Invited Talk]
The key supports for developing new drugs and medical devices in Japan Yutaka Natsumeda (KSLION) MICT2015-41 |
Although Japan is far behind USA or EU countries in developing new drugs and innovative medical devices, it would not be... [more] |
MICT2015-41 pp.13-16 |
TL |
2015-12-13 12:00 |
Tokyo |
Room 303/304/305, Building #8, Waseda University |
Network of using Japanese
-- A case study of the Nurse and Careworker Candidates from Indonesia Under the Economic Partnership Agreement -- Mamiko Kato (Waseda Univ.) TL2015-50 |
This paper reports on a qualitative study regarding nurse and careworker candidates from abroad living and working in Ja... [more] |
TL2015-50 pp.59-60 |
SDM, ICD |
2015-08-25 09:30 |
Kumamoto |
Kumamoto City |
[Invited Talk]
Low-Power Embedded ReRAM Technology for IoT Applications Makoto Ueki, Akira Tanabe, Hiroshi Sunamura, Mitsuru Narihiro, Kazuya Uejima, Koji Masuzaki, Naoya Furutake, Akira Mitsuiki, Koichi Takeda, Takashi Hase, Yoshihiro Hayashi (Renesas Electronics) SDM2015-65 ICD2015-34 |
A low-power 2Mb ReRAM macro was developed in 90 nm CMOS platform, demonstrating lower power data-writing (x1/7-x1/10) an... [more] |
SDM2015-65 ICD2015-34 pp.41-46 |
SDM |
2014-10-17 13:00 |
Miyagi |
Niche, Tohoku Univ. |
[Invited Talk]
Analysis of Multi-Trap Random Telegraph Noise Using Charging History Effects in Nano-Scaled MOSFETs Toshiaki Tsuchiya (Shimane Univ.) SDM2014-92 |
We propose a novel method for analyzing random telegraph noise (RTN) by using charging history effects on the traps part... [more] |
SDM2014-92 pp.47-54 |
SDM |
2013-11-15 15:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Impacts of Channel Doping on Random Telegraph Signal Noise and Successful Noise Suppression by Mobility Enhancement Jiezhi Chen, Yusuke Higashi, Izumi Hirano, Yuichiro Mitani (Toshiba) SDM2013-114 |
In this work, impacts of channel doping concentration on single-trap and multiple-trap induced random telegraph signal (... [more] |
SDM2013-114 pp.83-86 |
SDM |
2013-10-18 14:00 |
Miyagi |
Niche, Tohoku Univ. |
Study of Time Constant Analysis in Random Telegraph Noise at the Subthreshold Voltage Region Akihiro Yonezawa, Akinobu Teramoto, Toshiki Obara, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2013-98 |
We extracted time constants of capture and emission of Random Telegraph Noise (RTN), and their dependencies of the gate-... [more] |
SDM2013-98 pp.51-56 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-26 16:00 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2012-70 DC2012-36 |
Designing reliable systems has become more difficult in recent years.
In this paper, statistical nature of RTN-induced ... [more] |
VLD2012-70 DC2012-36 pp.63-68 |
SDM |
2012-11-15 15:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Neutral and Attractive Traps in Random Telegraph Signal Noise Phenomena using (100)- and (110)-Oriented CMOSFETs Jiezhi Chen, Izumi Hirano, Kosuke Tatsumura, Yuichiro Mitani (Toshiba Corp) SDM2012-103 |
(To be available after the conference date) [more] |
SDM2012-103 pp.21-24 |
CNR |
2012-06-25 15:45 |
Kanagawa |
Keio Univ. (Hiyoshi) |
Information support by robot partner using cloud service Tang Dalai, Naoyuki Kubota (TMU) CNR2012-3 |
In previous work, we propose an information support system for elderly people based on sensor networks. However in order... [more] |
CNR2012-3 pp.11-16 |
SDM |
2011-11-10 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Comprehensive Understanding of Random Telegraph Noise with Physics Based Simulation Yusuke Higashi, Nobuyuki Momo, Hisayo S. Momose, Tatsuya Ohguro, Kazuya Matsuzawa (Toshiba) SDM2011-118 |
Physical modeling of transient and frequency domain noise simulation for random telegraph noise (RTN) is conducted, cons... [more] |
SDM2011-118 pp.17-20 |
SDM |
2011-10-20 13:30 |
Miyagi |
Tohoku Univ. (Niche) |
[Invited Talk]
Characteristics Variability and Random Telegraph Noise in Fully Depleted SOI MOSFETs Toshiro Hiramoto (Univ. of Tokyo) SDM2011-97 |
Statistical characteristics of intrinsic channel fully depleted (FD) SOI MOSFETs and conventional bulk MOSFETs are compa... [more] |
SDM2011-97 pp.1-4 |
SDM |
2011-10-20 14:20 |
Miyagi |
Tohoku Univ. (Niche) |
Reduction of Random Telegraph Noise with Broad Channel MOSFET Hiroyoshi Suzuki, Rihito Kuroda, Akinobu Teramoto, Akihiro Yonezawa, Hiroaki Matsuoka, Taiki Nakazawa, Kenichi Abe, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2011-98 |
Drastic reduction of random telegraph noise (RTN) is demonstrated due to the broad channel MOSFET structure. We found th... [more] |
SDM2011-98 pp.5-9 |