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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 56  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2023-10-13
17:00
Miyagi Niche, Tohoku Univ. A study on the integration process of ReRAM and OFET utilizing Nitrogen doped LaB6/LaBxNy stacked structure
Jiaang Zhao, Shun-ichiro Ohmi (Tokyo Tech) SDM2023-61
LaBxNy insulator films are realized by utilizing Ar/N2 plasma reactive sputtering with nitrogen doped LaB6 as a target. ... [more] SDM2023-61
pp.46-49
MIKA
(3rd)
2023-10-10
15:35
Okinawa Okinawa Jichikaikan
(Primary: On-site, Secondary: Online)
[Poster Presentation] Epitaxial piezoelectric thin film multilayer structure for RF filters
Satoshi Tokai, Yanagitani Takahiko (Waseda Univ.)
Wireless communication devices such as smartphones are equipped with many frequency filters to transmit and receive only... [more]
SDM 2022-10-19
17:20
Online Online A study on threshold voltage control of MFSFET utilizing ferroelectric nondoped HfO2 thin films
Masakazu Tanuma, Joong-Won Shin, Shun-ichiro Ohmi (Tokyo Tech) SDM2022-63
Ferroelectric HfO2 thin films are able to be formed on Si substrate, which is difficult for conventional materials due t... [more] SDM2022-63
pp.38-42
SDM 2021-10-21
13:00
Online Online A study on Ar/N2-plasma sputtering gas pressure dependence on the LaBxNy insulator formation for non-volatile memory applications
Eun-Ki Hong, Shun-ichiro Ohmi (Tokyo Tech.) SDM2021-46
In this study, we investigated Ar/N2-plasma sputtering gas pressure dependence on the LaBxNy insulator formation. The fl... [more] SDM2021-46
pp.8-11
SDM 2021-10-21
13:25
Online Online A study on the effect of inter layers on ferroelectric nondoped HfO2 formation
Masakazu Tanuma, Joong-Won Shin, Shun-ichiro Ohmi (Tokyo Tech.) SDM2021-47
Ferroelectric HfO_2 thin films are able to be formed on Si substrate, which is difficult for conventional materials due ... [more] SDM2021-47
pp.12-15
CPM 2020-10-29
15:30
Online Online Characterization of Photocatalytic Gold-Doped Tantalum Pentoxide Thin Films Prepared Using a Simple Co-Sputtering Method
Kai Ito, Yuya Hashimoto, Kenta Miura, Katsuya Noguchi, Wataru Kada, Osamu Hanaizumi (Gunma Univ.) CPM2020-18
Gold-doped tantalum pentoxide (Ta2O5:Au) thin films were deposited using a co-sputtering method. From a transmission spe... [more] CPM2020-18
pp.27-30
SDM 2019-10-23
14:20
Miyagi Niche, Tohoku Univ. A study on ferroelectric non-doped HfO2 directly deposited on Si(100) substrate by introducing Hf interlayer
Masakazu Kataoka, Masaki Hayashi, Min Gee Kim, Shun-ichiro Ohmi (Tokyo Tech) SDM2019-54
In this study, we investigated suppression of SiO2 interfacial layer formation by introducing Hf interlayer to realize t... [more] SDM2019-54
pp.7-10
SDM 2018-10-18
10:20
Miyagi Niche, Tohoku Univ. Thin film formation of ferroelectric undoped HfO2 on Si(100) by RF magnetron sputtering
Min Gee Kim, Rengie Mark D. Mailig, Shun-ichiro Ohmi (Tokyo Tech.) SDM2018-58
In this study, we investigated thin film formation of ferroelectric undoped HfO2 directly deposited on p-Si(100). By po... [more] SDM2018-58
pp.31-34
SDM, EID 2017-12-22
13:15
Kyoto Kyoto University Flexible Device Applications Using GaSnO Thin Films
Ryo Takagi (Ryukoku Univ.), Kenta Umeda (NAIST), Tokiyoshi Matsuda (Ryukoku Univ.), Mutsunori Uenuma (NAIST), Mutsumi Kimura (Ryukoku Univ.) EID2017-16 SDM2017-77
Thin-film transistors (TFTs) and thermoelectric conversion elements were evaluated by using an amorphous Ga-Sn-O (a-GTO)... [more] EID2017-16 SDM2017-77
pp.23-28
SDM 2017-02-06
10:05
Tokyo Tokyo Univ. [Invited Talk] Impact of Dry Process Damage on Chemical Mechanical Planarization with Cu/low-k Structure
Masako Kodera, Hiroyuki Yano, Naoto Miyashita (Toshiba) SDM2016-139
We evaluated the impact of process damage caused by dry or sputtering on chemical mechanical planarization (CMP) with Cu... [more] SDM2016-139
pp.1-4
EID, SDM 2015-12-14
13:45
Kyoto Ryukoku University, Avanti Kyoto Hall Evaluation of In2O3 film deposited by RF magnetron sputtering
Toshihiro Yoshioka, Junji Ogawa, Masahiro Yuge, Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.) EID2015-15 SDM2015-98
Oxide semiconductors have attracted much attention as a promising alternative to hydrogenated amorphous Si (a-Si:H) and ... [more] EID2015-15 SDM2015-98
pp.27-30
EID, SDM 2015-12-14
15:15
Kyoto Ryukoku University, Avanti Kyoto Hall Characterization of SnO2/Al2O3 thin film and evaluation of thin film transistor
Junji Ogawa, Masahiro Yuge, Tosihiro Yosioka, Tokiyosi Matsuda, Mutsumi Kimura (Ryukoku Univ) EID2015-20 SDM2015-103
Oxide semiconductor with mixture of SnO2 and Al2O3at ratio Sn : Al = 9 : 1 was examined for active layer of thin film tr... [more] EID2015-20 SDM2015-103
pp.49-52
CPM 2015-08-11
09:40
Aomori   Low temperature deposition of HfNx film by radical reaction
Masaru Sato, Mayumi B. Takeyama, Atsushi Noya (Kitami inst. of Technol.) CPM2015-40
We have demonstrated the preparation of a low-temperature deposited HfNx film as a diffusion barrier applicable to the C... [more] CPM2015-40
pp.47-50
SDM, EID 2014-12-12
14:45
Kyoto Kyoto University Characteristics of Ga-Sn-Oxide thin film
Yuta Kato, Daiki Nishimoto, Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.) EID2014-28 SDM2014-123
Thin films of Ga-Sn-O (GTO) were studied for device applications. Transmittance of GTO thin films with composition ratio... [more] EID2014-28 SDM2014-123
pp.79-82
SDM, OME 2014-04-11
10:30
Okinawa Okinawa-Ken-Seinen-Kaikan Bldg. Electrical Characterization of SiO2 Films Deposited by RF Sputtering Using O2/Ar Mixture
Kimihiko Imura, Tatsuya Okada, Kiyoharu Shimoda, Kouya Sugihara, Takashi Noguchi (Univ. of Ryukyus) SDM2014-13 OME2014-13
For a fabrication of flexible display, high quality gate insulator films on a thermally durable substrate such as plasti... [more] SDM2014-13 OME2014-13
pp.55-57
MRIS, ITE-MMS 2013-07-12
13:50
Tokyo Chuo Univ. Surface Flatness Control of Ferromagnetic Alloy Thin Films with L10 Ordered Structure
Akira Itabashi, Mitsuru Ohtake (Chuo Univ.), Fumiyoshi Kirino (Tokyo University of the Arts), Masaaki Futamoto (Chuo Univ.) MR2013-7
FePd, FePt, and CoPt alloy epitaxial thin films with L10 structure are prepared on (001) single-crystal substrates of Mg... [more] MR2013-7
pp.7-12
CPM 2012-10-26
14:15
Niigata   Examination of Resistivity of AZO Thin Films Deposited by Sputtering Method
Katsuhito Nagoshi, Yusuke Tomiguchi, Hidehiko Shimizu, Haruo Iwano, Takahiro Kawakami, Yasuo Fukushima, Kotaro Nagata, Nozomu Tsuboi, Takahiro Nomoto (Niigata Univ.) CPM2012-95
We examined the effects of the substrate temperature and post-annealing in vacuum less than 2.0×10-6 Torr of AZO thin fi... [more] CPM2012-95
pp.13-16
US 2012-09-24
14:45
Akita Tegata Campus, Akita Univ. Fabrication of polarity-inverted ZnO films using ion bombardment to the substrate during an RF magnetron sputtering
Ryo Ikoma (Doshisha Univ.), Takahiko Yanagitani (Nagoya Inst.Tech.), Shinji Takayanagi (Doshisha Univ.), Masashi Suzuki (Nagoya Inst.Tech.), Hiroyuki Odagawa (Kumamoto NCT), Mami Matsukawa (Doshisha Univ.) US2012-61
ZnO have been used as SAW devices and high frequency transducer owing to its high electromechanical coupling. In general... [more] US2012-61
pp.21-25
SDM, ED
(Workshop)
2012-06-28
10:40
Okinawa Okinawa Seinen-kaikan [Poster Presentation] The surface morphology and electrical properties of NiO with various RF power and O2/(Ar+O2) gas mixture
Jonghun Kim, Gyohun Koo, Changju Lee, Sungho Hahm (Kyungpook National Univ.), Youngchul Jung (Gyeongju Univ.), Yougsoo Lee (Kyungpook National Univ.)
The crystalline structures of reactively sputtered nickel oxide films grown on SiO2/Si were systematically analyzed by a... [more]
ED, SDM, CPM 2012-05-18
14:50
Aichi VBL, Toyohashi Univ. of Technol. Preparation and evaluation of LiMn2O4 films prepared by sputtering method
Akio Niwa, Masaaki Isai, Mitsuhiro Nakamura, Takashi Noguchi (Shizuoka Univ.) ED2012-37 CPM2012-21 SDM2012-39
The LiMn2O4 films for Li secondary batteries have been prepared by a RF magnetron sputtering method. In this research, w... [more] ED2012-37 CPM2012-21 SDM2012-39
pp.99-104
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