IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 68 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED, LQE, CPM 2018-11-30
11:15
Aichi Nagoya Inst. tech. Fabrication and evaluation of p-type Cu-AlOx thin film by photochemical deposition method
Masanari Umemura, Masaya Ichimura (Nagoya Inst. Tech.) ED2018-46 CPM2018-80 LQE2018-100
AlOx has many physical properties suitable for electronic devices such as wide bandgap and high dielectric breakdown ele... [more] ED2018-46 CPM2018-80 LQE2018-100
pp.65-70
SDM 2018-11-08
11:20
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Proposal and device design of tunneling field effect transistor with oxide semiconductor and group-IV semiconductor
Kimihiko Kato, Hiroaki Matsui, Hitoshi Tabata, Mitsuru Takenaka, Shinichi Takagi (Univ. Tokyo) SDM2018-66
A novel bilayer tunneling field effect transistor (TFET) employing an attractive material combination of oxide-semicondu... [more] SDM2018-66
pp.11-16
ICD 2018-04-20
13:50
Tokyo   [Invited Talk] Memory LSI using crystalline oxide semiconductor FET
Jun Koyama, Takako Seki, Yuto Yakubo, Satoru Ohshita, Kazuma Furutani, Takahiko Ishizu, Tomoaki Atsumi, Yoshinori Ando, Daisuke Matsubayashi, Kiyoshi Kato, Takashi Okuda (SEL), Masahiro Fujita (The Univ. of Tokyo), Shunpei Yamazaki (SEL) ICD2018-12
FETs fabricated with a c-axis aligned crystalline In-Ga-Zn oxide semiconductor (CAAC-IGZO) have an extremely low off-sta... [more] ICD2018-12
pp.47-52
SDM, OME 2018-04-07
14:15
Okinawa Okinawaken Seinen Kaikan Origin of Schottky properties in InGaZnOX/AgOX hetero-interface and its application to flexible device.
Yusaku Magari, Hisao Makino, Shinsuke Hashimoto, Kenichiro Hamada, Kentaro Masuda, Mamoru Furuta (Kochi Univ. of Tech.) SDM2018-8 OME2018-8
Oxide heterojunction of the In–Ga–Zn–O (IGZO) and the silver oxide (AgOX) has been reported to exhibit better Schottky c... [more] SDM2018-8 OME2018-8
pp.33-36
SDM 2018-01-30
11:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Proposal and demonstration of oxide-semiconductor/(Si, SiGe, Ge) bilayer tunneling field effect transistor with type-II energy band alignment
Kimihiko Kato, Hiroaki Matsui, Hitoshi Tabata, Mitsuru Takenaka, Shinichi Takagi (Univ. of Tokyo) SDM2017-92
A novel bilayer tunneling field effect transistor (TFET) employing an attractive material combination of oxide-semicondu... [more] SDM2017-92
pp.5-8
SDM, EID 2017-12-22
13:15
Kyoto Kyoto University Flexible Device Applications Using GaSnO Thin Films
Ryo Takagi (Ryukoku Univ.), Kenta Umeda (NAIST), Tokiyoshi Matsuda (Ryukoku Univ.), Mutsunori Uenuma (NAIST), Mutsumi Kimura (Ryukoku Univ.) EID2017-16 SDM2017-77
Thin-film transistors (TFTs) and thermoelectric conversion elements were evaluated by using an amorphous Ga-Sn-O (a-GTO)... [more] EID2017-16 SDM2017-77
pp.23-28
SDM, EID 2017-12-22
13:30
Kyoto Kyoto University Seebeck effect measurement of rare metal free oxide semiconductor
Ryuki Nomura, Tatsuya Aramaki, Tokiyoshi Matsuda (Ryukoku Univ.), Kenta Umeda, Mutsunori Uenuma (NAIST), Mutsumi Kimura (Ryukoku Univ.) EID2017-17 SDM2017-78
It is thought that if we convert thermal energy to electric energy efficiently, we can reduce the amount of oil used. Ho... [more] EID2017-17 SDM2017-78
pp.29-34
CPM 2017-07-21
14:06
Hokkaido   Study on the ZnO thin films prepared by sol-gel method
Yukio Suganuma, Yasushi Takano (Shizuoka Univ.) CPM2017-23
Zinc oxide (ZnO) and magnesium zinc oxide thin films were prepared by the sol-gel method. We charactierized the films us... [more] CPM2017-23
pp.9-13
ED, SDM 2017-02-24
10:50
Hokkaido Centennial Hall, Hokkaido Univ. Fabrication of Zinc Oxide-based Thin Films Transistors by a Solution Process and a Direct Patterning of Oxide Thin Films by a Thermal Nanoimprint Method
Fumiya Kimura, Alhanaki Abdullah, Yi Sun, Shota Sasaki, Koki Nagayama, Masatoshi Koyama, Toshihiko Maemoto, Shigehiko Sasa (OIT) ED2016-132 SDM2016-149
Zinc oxide (ZnO) is transparent semiconductor material in visible light wavelength because it has band gap energy of 3.3... [more] ED2016-132 SDM2016-149
pp.13-16
SDM, EID 2016-12-12
16:15
Nara NAIST Characterization of planar synapses with GTO thin films
Keisuke Ikushima, Kenta Umeda, Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.) EID2016-27 SDM2016-108
Neural networks are information processing models based on the human brain, and they have been activity studied.
Howeve... [more]
EID2016-27 SDM2016-108
pp.81-84
CPM, LQE, ED 2016-12-13
13:00
Kyoto Kyoto University Growth and application of corundum-structured n- and p-type wide band gap oxide semiconductors
Kentaro Kaneko (Kyoto Univ.), Toshimi Hitora (FLOSFIA INC.), Shizuo Fujita (Kyoto Univ.) ED2016-74 CPM2016-107 LQE2016-90
Electronic carrier concentrations in corundum-structured α-In2O3 thin films decreased by being doped with a Mg ion. A M... [more] ED2016-74 CPM2016-107 LQE2016-90
pp.85-88
CPM 2016-11-19
11:15
Ishikawa   Microwave activated chemical bath deposition of ZnO thin films
Hiroaki Yoshiyachi, Yasushi Takano (Shizuoka Univ.) CPM2016-72
Zinc oxide (ZnO) film has been deposited using chemical bath deposition (CBD).We compared ZnO fims deposited by microwav... [more] CPM2016-72
pp.55-58
SANE 2016-10-20
14:20
Osaka OIT UMEKITA Knowledge Center [Special Talk] Intelligent Electronic Nose with Metal-Oxide Gas Sensors and its Applicability to Smell Communication
Sigeru Omatu (OIT) SANE2016-40
In this paper, we will show the e-nose system using neural networks and its
application to fire detection system. Fina... [more]
SANE2016-40
pp.3-11
ED 2016-07-23
15:05
Tokyo Tokyo Metropolitan Univ. Minami-Osawa Campus, International House Effects of post-deposition anneal on SiO2 layer on Ga2O3
Keita Konishi, Takafumi Kamimura, Man Hoi Wong (NICT), Kohei Sasaki, Akito Kuramata, Shigenobu Yamakoshi (Tamura Corp.), Masataka Higashiwaki (NICT) ED2016-29
Ga2O3 is an attractive new oxide semiconductor for next-generation power devices due to its extremely large bandgap of 4... [more] ED2016-29
pp.11-15
SDM, OME 2016-04-09
09:30
Okinawa Okinawa Prefectural Museum & Art Museum [Invited Talk] Nonvolatile Memory Applications Using Oxide Thin-Film Transistors
Sung-Min Yoon, So-Jung Kim, Min-Ji Park, Da-Jeong Yun (Kyung Hee Univ.) SDM2016-12 OME2016-12
The embeddable nonvolatile memory devices with such characteristics as mechanical flexibility and/or transparency to the... [more] SDM2016-12 OME2016-12
pp.49-52
ED, SDM 2016-03-03
14:00
Hokkaido Centennial Hall, Hokkaido Univ. [Invited Talk] A Recent Development in Thin-Film Device Applications using Oxide Semiconductors
Toshihiko Maemoto, Yi Sun, Souhei Matsuda, Shota Sasaki, Kouhei Ashida, Oliver Kaltstein, Masatoshi Koyama, Kazuto Koike, Mitsuaki Yano, Shigehiko Sasa (Osaka Inst. Tech.) ED2015-121 SDM2015-128
We report on the fabrication and characterization of flexible thin-film-transistors using a transparent zinc oxide (ZnO)... [more] ED2015-121 SDM2015-128
pp.1-6
ED 2016-01-20
11:20
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] State-of-the-art technology of gallium oxide power devices
Masataka Higashiwaki, Man Hoi Wong, Keita Konishi (NICT), Kohei Sasaki (Tamura/NICT), Ken Goto (Tamura/TAT), Kazushiro Nomura, Quang Tu Thieu, Rie Togashi, Hisashi Murakami, Yoshinao Kumagai, Bo Monemar, Akinori Koukitu (TAT), Akito Kuramata, Takekazu Masui, Shigenobu Yamakoshi (Tamura) ED2015-114
Gallium oxide (Ga{$_{2}$}O{$_{3}$}) is one of oxide semiconductors and has excellent material properties for power devic... [more] ED2015-114
pp.13-18
EID, SDM 2015-12-14
13:45
Kyoto Ryukoku University, Avanti Kyoto Hall Evaluation of In2O3 film deposited by RF magnetron sputtering
Toshihiro Yoshioka, Junji Ogawa, Masahiro Yuge, Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.) EID2015-15 SDM2015-98
Oxide semiconductors have attracted much attention as a promising alternative to hydrogenated amorphous Si (a-Si:H) and ... [more] EID2015-15 SDM2015-98
pp.27-30
EID, SDM 2015-12-14
14:00
Kyoto Ryukoku University, Avanti Kyoto Hall Characterization of GaxSn1-xO thin film by the mist CVD method
Masahiro Yuge, Junji Ogawa, Tosihiro Yosioka, Yuta Kato, Tokiyosi Matsuda, Mutsumi Kimura (Ryukoku Univ) EID2015-16 SDM2015-99
Thin films of GaxSn1-xO (GTO) for an active layer of thin film transistor (TFT) were deposited with different substrate ... [more] EID2015-16 SDM2015-99
pp.31-34
EID, SDM 2015-12-14
15:15
Kyoto Ryukoku University, Avanti Kyoto Hall Characterization of SnO2/Al2O3 thin film and evaluation of thin film transistor
Junji Ogawa, Masahiro Yuge, Tosihiro Yosioka, Tokiyosi Matsuda, Mutsumi Kimura (Ryukoku Univ) EID2015-20 SDM2015-103
Oxide semiconductor with mixture of SnO2 and Al2O3at ratio Sn : Al = 9 : 1 was examined for active layer of thin film tr... [more] EID2015-20 SDM2015-103
pp.49-52
 Results 21 - 40 of 68 [Previous]  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan