IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]		 2020-11-18
14:25		 Online Online On-chip power supply noise monitoring for evaluation of multi-chip board power delivery networks
Daichi Nakagawa, Kazuki Yasuda, Masaru Mashiba, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2020-31 ICD2020-51 DC2020-51 RECONF2020-50		 In these days, information and communication technology has been evolving more and more, and hardware security has been ... [more] VLD2020-31 ICD2020-51 DC2020-51 RECONF2020-50
pp.115-117
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2019-03-17
13:00		 Kagoshima Nishinoomote City Hall (Tanega-shima) MOSFET-based ultra high resistance configuration for ultra low current sensing
Xinghuai Zhang, Shigetoshi Nakatake (Univ. of Kitakyushu) CPSY2018-103 DC2018-85		 In this work, we propose a method to configure an ultrahigh resistance of 1GΩ or more on a chip, which is used for I-V c... [more] CPSY2018-103 DC2018-85
pp.103-108
ICD, MW 2018-03-01
15:05		 Shiga The University of Shiga Prefecture [Poster Presentation] Relationship of Structure and Characteristics of On-Chip Multi-Layered Inductors
Akira Tsuchiya (Univ. Shiga Prefecture) MW2017-183 ICD2017-107		 This paper illustrates characteristics exploration of on-chip multi-layered inductors. Multi-layered inductor uses
not ... [more]		 MW2017-183 ICD2017-107
p.51
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2010-11-29
11:20		 Fukuoka Kyushu University A Consideration of Substrate Noise Sensitivity of Analog Elements
Satoshi Takaya, Yoji Bando, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) CPM2010-126 ICD2010-85		 Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometor... [more] CPM2010-126 ICD2010-85
pp.13-17
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan