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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, WPT (Joint) |
2016-01-29 13:05 |
Kumamoto | Kumamoto National Colle. Technology | Influence of Surface Roughness of Electrode in EM Radiation Caused by Micro Gap ESD Kenichiro Abe, Ken Kawamata, Shigeki Minegishi (TGU), Osamu Fujiwara (NIT)  EMCJ2015-118 |
Impulsive electromagnetic noise is caused by ESD. Especially, micro gap discharge of less than 1kV produces GHz band wid... [more] | EMCJ2015-118 pp.83-86 |
| EMCJ, IEE-EMC | 2011-10-28 10:35 |
Aomori | Hachinohe Grand Hotel | Variations of radiated electromagnetic field due to low voltage ESD in spherical electrode. Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (TGU), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2011-81 |
Amplitude properties of radiated electromagnetic field caused by low voltage ESD (electrostatic discharge) in spherical ... [more] | EMCJ2011-81 pp.1-4 |
| EMCJ (2nd) |
2010-05-28 14:00 |
Miyagi | Cyberscience Center, Tohoku University | Measurement of the radiated electromagnetic filed intensity using spherical electrodes and a horn antenna Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) |
The micro-gap discharge as the low voltage ESD shows very fast transition duration of about 32 ps or less. Besides, brea... [more] | |
| EMCJ | 2010-04-23 14:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Wideband Measurement of Radiated Electromagnetic Field Intensity due to the low voltage ESD Ken Kawamata (HIT), Shigeki Minegishi (TGU), Osamu Fujiwara (NIT) EMCJ2010-9 |
The breakdown voltage and radiated electromagnetic field intensity due to micro gap discharge were examined in experimen... [more] | EMCJ2010-9 pp.45-48 |
| EMCJ, IEE-EMC | 2009-12-18 14:15 |
Gifu | NIFS | Study on Radiated Electromagnetic Field Intensity due to Micro Gap Discharge as the low voltage ESD. Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) |
The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in ex... [more] | EMCJ2009-95 pp.59-64 |
| AP | 2009-09-04 14:50 |
Aomori | Hachinohe Inst. of Tech. | Experimental Study of Radiated Electromagnetic Field Intensity due to Micro Gap Discharge Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) AP2009-100 |
The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in ex... [more] | AP2009-100 pp.121-124 |
| EMCJ | 2008-11-21 11:10 |
Tokyo | AIST Tokyo Waterfront | A Method for Estimating Wideband Transients Using Transmission Loss of High Performance Semi-Rigid Coaxial Cable. Ken Kawamata (Hachinohe Institute of Technology), Yoshinori Taka (Nagoya Institute of Technology), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Institute of Technology) EMCJ2008-82 |
The very fast transients due to micro-gap discharges as low voltage electrostatic discharges (ESDs) were investigated in... [more] | EMCJ2008-82 pp.45-48 |
| EMCJ, EMD | 2008-07-18 14:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Experimental Study on Radiated Electromagnetic Field Strength due to Micro Gap Discharge Below 1kV Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi, Akira Haga (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) EMCJ2008-45 EMD2008-27 |
Abstract Relationship between breakdown field strength and radiated electromagnetic field strength was examined in expe... [more] | EMCJ2008-45 EMD2008-27 pp.27-30 |
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