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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
IE, ITE-ME, IPSJ-AVM, ITE-CE [detail] 2016-08-09
10:00		 Fukuoka   Technique Using Near-Infrared Imaging for Reading Information Embedded Into Objects Fabricated With 3-D Printers
Masahiro Suzuki, Kousuke Nakamura, Keigo Takazawa (Kanagawa Inst. Tech.), Youichi Takashima (NTT), Hideyuki Torii, Kazutake Uehira (Kanagawa Inst. Tech.) IE2016-55		 We evaluated our previously proposed technique of protecting copyrights of digital data for 3-D printing. The proposed t... [more] IE2016-55
pp.57-61
AI 2015-12-04
15:55		 Fukuoka Kyutech-Salite The Technics of predicting error of Semiconductor manufacturing equipment by Operation sounds
Daiki Nakata, Noriyuki Kushiro (Kyutech) AI2015-23		 In Semiconductor manufacturing factory, Semiconductor manufacturing equipment is always operated in the long term to imp... [more] AI2015-23
pp.61-66
DC 2014-02-10
12:25		 Tokyo Kikai-Shinko-Kaikan Bldg. An Efficient Test Pattern Generator based on Mersenne Twister algorithm
Sayaka Satonaka, Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT) DC2013-86		 To perform a high reliable manufacturing test with a reasonable cost, LFSR is widely used as test pattern generator. How... [more] DC2013-86
pp.43-48
ICD 2014-01-28
10:00		 Kyoto Kyoto Univ. Tokeidai Kinenkan [Invited Talk] Adaptive Performance Compensation with On-Chip Variation Monitoring
Masanori Hashimoto (Osaka Univ.) ICD2013-100		 This paper discusses adaptive performance control with two types of on-chip variation sensors. The first sensor
aims to... [more]		 ICD2013-100
pp.1-6
VLD 2013-03-04
14:40		 Okinawa Okinawa Seinen Kaikan Self-Compensation of Manufacturing Variability using On-Chip Sensors
Yuma Higuchi, Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2012-138		 Manufacturing variability is becoming more influential on circuit performance and parametric yield, and is predicted to ... [more] VLD2012-138
pp.13-17
VLD 2010-03-10
15:50		 Okinawa   Variation-Tolerant Decomposition of MOS Transistor
Bo Liu, Atsushi Ochi, Shigetoshi Nakatake (Univ. of Kitakyushu) VLD2009-104		 Aiming at the layout automation based on the regular bulk structure
in MOS analog circuits, we study how to decompose a... [more]		 VLD2009-104
pp.31-36
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