IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 41 - 60 of 154 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2014-11-26
16:15
Oita B-ConPlaza High speed design of sub-threshold circuit by using DTMOS
Yuji Fukudome, Youhua Shi, Nozomu Togawa (Waseda Univ.), Kimiyoshi Usami (Shibaura Inst. of Tech), Masao Yanagisawa (Waseda Univ.) VLD2014-88 DC2014-42
Low power consumption is achieved by operating circuits in sub-threshold region.
However, in sub-threshold region, the... [more]
VLD2014-88 DC2014-42
pp.117-121
IE, ICD, VLD, IPSJ-SLDM [detail] 2014-10-02
16:15
Miyagi   A Low Supply Voltage Six-Transistor CMOS SRAM Employing Adaptively Lowering Memory Cell Supply Voltage for "Write" Operation
Nobuaki Kobayashi (Nagaoka Univ. of Tech.), Ryusuke Ito, Tadayoshi Enomoto (Chuo Univ.) VLD2014-66 ICD2014-59 IE2014-45
We developed and applied a new circuit, called the “Self-controllable Voltage Level (SVL)” circuit, not only to expand b... [more] VLD2014-66 ICD2014-59 IE2014-45
pp.33-38
ICD, SDM 2014-08-05
10:25
Hokkaido Hokkaido Univ., Multimedia Education Bldg. Development of a Low Standby Power, Six-Transistor CMOS SRAM Employing a Single Power Supply
Ryusuke Ito (Chuo Univ.), Nobuaki Kobayashi (NUT), Tadayoshi Enomoto (Chuo Univ.) SDM2014-73 ICD2014-42
We developed and applied a new circuit, called the “Self-controllable Voltage Level (SVL)” circuit, not only to expand b... [more] SDM2014-73 ICD2014-42
pp.59-64
ICD, SDM 2014-08-05
13:05
Hokkaido Hokkaido Univ., Multimedia Education Bldg. [Invited Talk] Oxide Semiconductor-based Transistors Formed in LSI Interconnects
Hiroshi Sunamura, Naoya Furutake, Shinobu Saito, Mitsuru Narihiro, Yoshihiro Hayashi (REL) SDM2014-76 ICD2014-45
We report on the latest progress on our proposed new transistor technology called BEOL-FET, in which we form oxide-based... [more] SDM2014-76 ICD2014-45
pp.77-82
SDM 2014-06-19
14:05
Aichi VBL, Nagoya Univ. Theoretical Study of Electron Transportation in NanoScale Channel
Genki Fujita, Taro Shiokawa (Univ. of Tsukuba), Yukihiro Takada (Tokyo Univ of Science), Satoru Konabe (Univ. of Tsukuba), Masakazu Muraguchi (Tohoku Univ.), Takahiro Yamamoto (Tokyo Univ. of Science), Tetsuo Endoh (Tohoku Univ.), Yasuhiro Hatsugai (Univ. of Tsukuba), Kenji Shiraishi (Nagoya Univ.) SDM2014-53
Numerical calculation of electron transportation considering long-range Coulomb interaction in Nanoscale channel [more] SDM2014-53
pp.55-58
CPM, ED, SDM 2014-05-28
16:10
Aichi   Static and dynamic operations of MOSFET by propagated surface plasmon signal
Hiroki Sakai, Takuma Aihara, Ayumi Takeda, Masashi Fukuhara, Masashi Ota, Yu Kimura, Yuya Ishii, Mitsuo Fukuda (Toyohashi Univ. of Tech.) ED2014-28 CPM2014-11 SDM2014-26
Surface plasmon polaritons (SPPs) have attracted considerable attention as a means of increasing integration density of ... [more] ED2014-28 CPM2014-11 SDM2014-26
pp.51-54
ED 2014-04-18
09:00
Yamagata The 100th Anniversary Hall, Yamagata University Fabrication of Fully Solution-processed Organic Thin-Film Transistor and Application to Integrated Circuits
Yasunori Takeda, Yu Kobayashi (Yamagata Univ.), Faiz Adi Ezarudin Bin Adib (SATO HOLDINGS), Kenjiro Fukuda, Daisuke Kumaki, Shizuo Tokito (Yamagata Univ.) ED2014-11
Organic Thin Film Transistor (OTFT) is very attractive for a varied range of applications such as flexible display, and ... [more] ED2014-11
pp.41-45
VLD 2014-03-03
14:30
Okinawa Okinawa Seinen Kaikan nMOS Dynamic Shift Registers for Driver Circuit of Small LCD and Their Evaluations
Shinji Higa, Tomohiro Kurita, Shuji Tsukiyama (Chuo Univ.) VLD2013-137
Driver circuits for small LCD (Liquid Crystal Display) are formed on the same glass substrate as LCD by means of TFTs (T... [more] VLD2013-137
pp.19-24
SDM 2014-01-29
13:55
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Analysis of Transistor Characteristics in Distribution Tails beyond ±5.4σ of 11 Billion Transistors
Tomoko Mizutani, Anil Kumar, Toshiro Hiramoto (Univ. of Tokyo) SDM2013-142
Transistors in distribution tails of 11G (11 billion) transistors were intensively measured and compared with transistor... [more] SDM2013-142
pp.31-34
MWP, EMT, PN, LQE, OPE, EST, IEE-EMT [detail] 2014-01-24
17:00
Kyoto Doshisha University Static and dynamic characteristics of surface plasmon detector-MOSFET integrated circuit
Takuma Aihara, Ayumi Takeda, Masashi Fukuhara, Yuya Ishii, Mitsuo Fukuda (Toyohashi Univ. of Tech.) PN2013-82 OPE2013-196 LQE2013-182 EST2013-131 MWP2013-102
Optical interconnections (OIs) in integrated circuits have been developed for high-speed and large-capacity date-process... [more] PN2013-82 OPE2013-196 LQE2013-182 EST2013-131 MWP2013-102
pp.303-306
ED, MW 2014-01-16
11:45
Tokyo Kikai-Shinko-Kaikan Bldg. Depletion-mode gallium oxide metal-oxide-semiconductor field-effect transistors fabricated by using Si-ion implantation
Masataka Higashiwaki (NICT), Kohei Sasaki (Tamura/NICT), Man Hoi Wong, Takafumi Kamimura, Daivasigamani Krishnamurthy (NICT), Akito Kuramata (Tamura), Takekazu Masui (Koha), Shigenobu Yamakoshi (Tamura) ED2013-116 MW2013-181
Depletion-mode gallium oxide (Ga2O3) MOSFETs were fabricated on single-crystal beta-Ga2O3 (010) substrates. We applied S... [more] ED2013-116 MW2013-181
pp.35-39
SDM 2013-11-15
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. Quantum transport simulation of ultrasmall III-V MOSFETs using Wigner Monte Carlo approach
Masaki Ohmori, Shunsuke Koba, Yosuke Maegawa (Kobe Univ.), Hideaki Tsuchiya (Kobe Univ./JST), Yoshinari Kamakura, Nobuya Mori (Osaka Univ./JST), Matsuto Ogawa (Kobe Univ.) SDM2013-111
In this study, the impact of source-drain (SD) direct tunneling in III-V metal-oxide-semiconductor field-effect transist... [more] SDM2013-111
pp.65-70
SDM, ICD 2013-08-02
16:05
Ishikawa Kanazawa University Input common-mode voltage of the opamp improved wide-area by bulk-control
Mamoru Ohsawa, Cong-Kha Pham (UEC) SDM2013-85 ICD2013-67
We examine the wide area of the common-mode input voltage range of the op amp that operates at low
power supply voltage... [more]
SDM2013-85 ICD2013-67
pp.105-110
SDM 2013-06-18
17:25
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] 4H-SiC MOS interface states studied by electron spin resonance spectroscopy
T. Umeda (Univ. of Tsukuba), M. Okamoto, R. Kosugi (AIST), R. Arai, Y. Satoh (Univ. of Tsukuba), S. Harada, Hajime Okumura (AIST), T. Makino, Takeshi Ohshima (JAEA) SDM2013-64
Normally-off 4H-SiC MOSFETs (Metal-Oxide-Semiconductor Field Effect Transistors) are promising devices for power electro... [more] SDM2013-64
pp.101-105
MW 2013-03-06
10:25
Hiroshima Hiroshima Univ. A High Power CMOS Cascode Transistor with distributed grounded gate capacitor
Katsuya Kato, Miyo Miyashita, Shintaro Shinjo, Kenichi Horiguchi, Kazutomi Mori (Mitsubishi Electric) MW2012-159
We propose a high power CMOS cascode transistor with distributed grounded gate capacitor using 0.18-um CMOS technology. ... [more] MW2012-159
pp.7-10
MW 2013-03-08
11:20
Hiroshima Hiroshima Univ. [Special Invited Talk] Current Status and Future Prospect for Analog and RF CMOS Integrated Circuits
Akira Matsuzawa (Tokyo Inst. of Tech.) MW2012-185
Current status and future prospect for analog and RF CMOS integrated circuits will be discussed. The physical relationsh... [more] MW2012-185
p.147
SDM, ED 2013-02-28
09:00
Hokkaido Hokkaido Univ. Integration of CMOS 1-bit Analog Selector and Single-Electron Transistors Operating at Room Temperature
Ryota Suzuki, Motoki Nozue, Takuya Saraya, Toshiro Hiramoto (Univ. of Tokyo) ED2012-137 SDM2012-166
In this paper, integrated circuit operation of CMOS analog selector circuits and silicon single-electron transistors is ... [more] ED2012-137 SDM2012-166
pp.47-52
ICD, SDM 2012-08-02
10:00
Hokkaido Sapporo Center for Gender Equality, Sapporo, Hokkaido Self-Improvement of Cell Stability in SRAM by Post Fabrication Technique
Anil Kumar, Takuya Saraya (Univ. of Tokyo), Shinji Miyano (STARC), Toshiro Hiramoto (Univ. of Tokyo) SDM2012-65 ICD2012-33
The post fabrication technique for self-improvement of SRAM cell stability is validated by experiment using 1k DMA SRAM ... [more] SDM2012-65 ICD2012-33
pp.13-16
ICD, SDM 2012-08-02
13:00
Hokkaido Sapporo Center for Gender Equality, Sapporo, Hokkaido [Invited Lecture] Silicon on Thin Buried Oxide (SOTB) Technology for Ultralow-Power (ULP) Applications
Nobuyuki Sugii, Toshiaki Iwamatsu, Yoshiki Yamamoto, Hideki Makiyama, Takaaki Tsunomura, Hirofumi Shinohara, Hideki Aono, Hidekazu Oda, Shiro Kamohara, Yasuo Yamaguchi (LEAP/Renesas), Tomoko Mizutani, Toshiro Hiramoto (IIS, The University of Tokyo) SDM2012-68 ICD2012-36
Needs for low-power CMOS devices are still increasing. Ultralow-voltage-operation (ULV) CMOS with maximum power efficien... [more] SDM2012-68 ICD2012-36
pp.29-32
ICD, ITE-IST 2012-07-26
14:20
Yamagata Yamagata University [Invited Talk] Smart Power LSI Technology Development -- High Performance and High Reliability BiC-DMOS Device Development --
Kenichi Hatasako, Tetsuya Nitta, Masami Hane, Shigeto Maegawa (Renesas Electronics Co.) ICD2012-23
This paper presents high performance and high reliability BiC-DMOS device development, which act as the driving force de... [more] ICD2012-23
pp.25-29
 Results 41 - 60 of 154 [Previous]  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan