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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2019-12-20 16:30 |
Wakayama |
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Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] |
DC2019-85 pp.37-42 |
AP |
2017-08-24 13:00 |
Hokkaido |
National Institute of Technology, Hakodate College |
Stripline-Fed Patch Antenna with Long-Term Reliable Conductive Vias Koh Hashimoto, Makoto Higaki (Toshiba) AP2017-73 |
In stripline-fed patch antennas built in multilayer substrate, the long-term reliability of through-holes used for suppr... [more] |
AP2017-73 pp.29-34 |
R |
2016-12-16 15:55 |
Kanagawa |
Maholoba Minds Miura (Miura City, Kanagawa Prefecture) |
A Quantitative Study on Bug-fixing Process in Open Source Software Takahiro Ushiroda (Hiroshima Univ.), Yasuhiro Saito (JCGA), Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2016-57 |
Open-source software (OSS) is computer software with its source code made available with a license in which the
copyri... [more] |
R2016-57 pp.19-24 |
R |
2015-06-19 14:50 |
Tokyo |
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A Study of Short-time Evaluation Method for Aluminum Electrolytic Capacitor Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba) R2015-13 |
By using quality engineering, we developed a technique to evaluate aluminum electrolytic capacitor in a shorter time tha... [more] |
R2015-13 pp.19-24 |
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