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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ | 2023-06-09 16:20 |
Hokkaido | Otaru Chamber of Commerce & Industry (Primary: On-site, Secondary: Online) |
Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST)  EMCJ2023-28 |
Fault injection attacks using intentional electromagnetic interference (IEMI) against cryptographic devices have become ... [more] | EMCJ2023-28 pp.82-86 |
| HWS, ICD [detail] | 2021-10-19 10:50 |
Online | Online | Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17 |
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] | HWS2021-43 ICD2021-17 pp.13-18 |
| EMCJ | 2019-07-18 13:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fundamental study on influence of intentional electromagnetic interference on IC communication Hikaru Nishiyama, Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2019-23 |
Low-Power Intentional Electromagnetic Interference (IEMI) has been reported, which causes malfunction without damaging t... [more] | EMCJ2019-23 pp.29-33 |
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module Mitsuki Takenouchi (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-79 |
In a fault injection method based on Intentional Electromagnetic Interference (IEMI) from a power line, the phase of the... [more] | EMCJ2018-79 pp.61-62 |
| EMCJ | 2018-07-27 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30 |
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] | EMCJ2018-30 pp.49-54 |
| HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] | 2018-07-25 14:25 |
Hokkaido | Sapporo Convention Center | Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven) ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19 |
Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported.... [more] | ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19 pp.77-81 |
| EMCJ | 2017-11-22 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-71 |
The intentional electromagnetic interference (IEMI) fault-injection method generates a fault by injecting a glitch into ... [more] | EMCJ2017-71 pp.41-44 |
| EMCJ, IEE-EMC, IEE-MAG | 2016-06-02 13:33 |
Overseas | NTU, Taiwan | [Poster Presentation]
Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2016-43 |
The existing intentional electromagnetic interference (IEMI) fault injection method based on continuous sinusoidal waves... [more] | EMCJ2016-43 pp.83-84 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2014-10-23 10:25 |
Akita | Akita Prefectural Univ. | Effect of Precisely Timed Intentional Electromagnetic Interference on Internal Operation in Cryptographic Device Mizuki Kobayashi, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-46 MW2014-102 EST2014-60 |
This paper presents a new intentional electromagnetic interference (IEMI) fault-injection method that can inject transie... [more] | EMCJ2014-46 MW2014-102 EST2014-60 pp.11-15 |
| EMCJ | 2014-07-10 15:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Feasibility of Fault-injected Timing Identification for Actual Cryptographic Devices Using Side-channel Information Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-23 |
The intentional electromagnetic interference (IEMI) fault-injection method using continuous sine waves causes random-byt... [more] | EMCJ2014-23 pp.37-42 |
| EMCJ, IEE-EMC | 2014-06-20 11:00 |
Hyogo | Kobe Univ. | Identification Method of Fault-injected Timing on Cryptographic Devices Using Side-channel Information Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-11 |
This paper describes a new technique to choose faulty ciphertexts available for Differential Fault Analysis (DFA) from t... [more] | EMCJ2014-11 pp.7-12 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2013-10-25 17:05 |
Miyagi | Tohoku Univ. | Fundamental Study on a Mechanism of Non-invasive Fault-injection at Arbitrary Timing of Cryptographic Processing Mizuki Kobayashi, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2013-90 MW2013-130 EST2013-82 |
In this paper, we introduce a new type of intentional electromagnetic interference (IEMI) fault-injection method with ti... [more] | EMCJ2013-90 MW2013-130 EST2013-82 pp.175-179 |
| EMCJ | 2010-01-21 10:00 |
Okinawa | University of the Ryukyus | Study on Impulse Radiation System Hidenori Sekiguchi, Shinji Seto (NICT) EMCJ2009-99 |
The security of electronic equipments is concerned by intentional electromagnetic interference (IEMI), because the elect... [more] | EMCJ2009-99 pp.7-12 |
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