| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, WPT (Joint) |
2018-06-14 13:35 |
Nagasaki | Experimental validation for waveform model of conducted disturbances below 150 kHz from power conversion equipment Farhan Mahmood, Yuichiro Okugawa, Jun kato (NTT)  EMCJ2018-11 |
International Electrotechnical Commission (IEC) specifies conducted immunity test wave as continuous wave (CW) in IEC 61... [more] | EMCJ2018-11 pp.1-6 |
|
| EMCJ, IEE-EMC | 2018-05-25 13:35 |
Nagano | Investigation for Radiated Immunity Testing Using White Gaussian Noise and Multitone Katsushige Harima (NICT), Daichi Akita, Tetsuya Nakamura (TOYO Corporation) EMCJ2018-6 |
This report describes the experimental investigation of radiated immunity testing, which applies broadband test signals ... [more] | EMCJ2018-6 pp.1-5 |
|
| SSS | 2018-03-27 15:40 |
Tokyo | Efficiency verification of Measurement of Electrostatic Discharge Noise that inflowing to an Electronic Equipment using an Optical Electric Field Probe Yuji Nakazono (Hitachi) SSS2017-35 |
Miss operation of an electronic equipment due to electromagnetic disturbance may directly lead to abnormal situation, so... [more] | SSS2017-35 pp.17-20 |
|
| EMCJ, MICT (Joint) |
2018-03-16 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Relation between Voltage Fluctuations of Internal Terminals and Output Terminal of Linear Regulator Katsumasa Fujiki (Kyoto Univ.), Tohlu Matsushima (Kyutech), Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2017-110 |
Immunity of voltage regulator when conducted disturbance is applied from supply voltage pin should be evaluated and simu... [more] | EMCJ2017-110 pp.31-36 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 14:55 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | Simulation Techniques for EMC Compliant Design of Automotive IC Chips and Modules Akihiro Tsukioka, Makoto Nagata, Kohki Taniguchi, Daisuke Fujimoto (Kobe Univ.), Rieko Akimoto, Takao Egami, Kenji Niinomi, Takeshi Yuhara, Sachio Hayashi (TOSHIBA), Rob Mathews, Karthik Srinivasan, Ying-Shiun Li, Norman Chang (ANSYS) CPM2017-84 ICD2017-43 IE2017-69 |
In recent years, electromagnetic compatibility (EMC) becomes a major concern among IC chips. EMC is characterized in two... [more] | CPM2017-84 ICD2017-43 IE2017-69 pp.27-32 |
| EMCJ, IEE-EMC, IEE-MAG | 2017-05-19 14:10 |
Overseas | Nanyang Technological University | [Invited Talk]
Towards High Speed and Less Interference: Virtual EMC Lab Richard Xian-Ke Gao, Huapeng Zhao, Eng Kee Chua, Binfang Wang, Weijiang Zhao (A*STAR IHPC) EMCJ2017-20 |
This paper presents an integrated analytical and numerical modeling approach based on EMC directives/standards for asses... [more] | EMCJ2017-20 pp.69-74 |
| EMCJ, WPT, PEM (Joint) |
2016-11-24 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Shortened Exponential Tapered-TEM Horn Antenna for EMC Measurements Katsushige Harima (NICT) EMCJ2016-84 |
This report describes the numerical analysis of the antenna characteristics of TEM horn antennas that applied tapered tr... [more] | EMCJ2016-84 pp.1-6 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2016-10-20 09:25 |
Miyagi | Tohoku Univ. | Results of EMC round robin test on emission and immunity test.
-- (2) Radiated immunity round robin test -- Yoshitsugu Okuda, Masahiro Inoue (KEC), Hiro Shida (Tokin), Hisashi Ninomiya (Roland), Kenji Masaoka (KEC), Minoru Yamanaka (UL), Osami Wada (Kyo Dai) EMCJ2016-61 MW2016-93 EST2016-57 |
In the previous report, we explained Round-Robin tests on radiated and conducted emission test research report/result. I... [more] | EMCJ2016-61 MW2016-93 EST2016-57 pp.5-10 |
| AP | 2016-04-22 09:55 |
Aichi | Chub university | Experimental Estimation of E-Field Distribution in a Vehicle under Multipath Propagation Environment Katsushige Harima (NICT), Tetsuya Nakamura, Daichi Akita (TOYO), Shinobu Ishigami (TGU) AP2016-8 |
As a basic study on radiated immunity testing for vehicles, this report describes the maximum E-field distribution in a ... [more] | AP2016-8 pp.41-45 |
| EMCJ, WPT (Joint) |
2016-01-28 13:10 |
Kumamoto | Kumamoto National Colle. Technology | Relationship between Leakage and Induction Magnetic Fields Characteristics of the Simplified Power Line Model
-- Comparison between No Branch and Outlet Branch -- Masamitsu Tokuda (Univ. of Tokyo), Yohei Toriumi, Kazuhiro Takaya, Yoshiharu Akiyama (NTT), Hiroyuki Ohsaki (Univ. of Tokyo) EMCJ2015-107 |
A high speed power line communication system using high frequency band may decrease its transmission speed due to distur... [more] | EMCJ2015-107 pp.23-28 |
| EMCJ, WPT (Joint) |
2016-01-29 09:00 |
Kumamoto | Kumamoto National Colle. Technology | Estimation of transmission line susceptibility to plane wave using BCI test method
-- Theoretical examination -- Misaki Hoshino (Tokai Univ.), Yoshio Kami, Fengchao Xiao (UEC), Majid Tayarani (IUST), Kimitoshi Murano (Tokai Univ.) EMCJ2015-114 |
A bulk current injection (BCI) test is carried out to clarify the conducted immunity of electronic equip-ment for an ext... [more] | EMCJ2015-114 pp.61-64 |
| EMCJ, WPT (Joint) |
2016-01-29 09:50 |
Kumamoto | Kumamoto National Colle. Technology | Study on test distance between EUT and antenna for radiated immunity test in close proximity to equipment Kazuhiro Takaya, Naomichi Nakamura, Yuichiro Okugawa, Yoshiharu Hiroshima (NTT) EMCJ2015-116 |
IEC Technical Committee TC77 Subcommittee SC77B studies a radiated immunity test in close proximity to equipment as an I... [more] | EMCJ2015-116 pp.71-75 |
| EMCJ, IEE-EMC | 2015-12-18 13:10 |
Aichi | TOYOTA CENTRAL R&D LABS., INC. | Evaluation of E-Fields Generating Antennas for Use in Close Proximity Radiated Immunity Testing Katsushige Harima, Shinobu Ishigami (NICT) EMCJ2015-95 |
This report describes the numerical analysis of the E-field uniformity over the measurement area in close proximity radi... [more] | EMCJ2015-95 pp.33-38 |
| AP (2nd) |
2015-09-04 13:25 |
Kyoto | ATR | Evaluation of an Exponentially Tapered TEM Horn Antenna Used for Close Proximity Radiated Immunity Testing Katsushige Harima, Shinobu Ishigami (NICT) |
This report describes the numerical analysis of the E-field uniformity over the measurement area in close proximity radi... [more] | |
| EMCJ | 2015-07-09 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-33 |
Predicting undesired behavior of IC caused by conducted electromagnetic disturbances at a design stage of electronic pro... [more] | EMCJ2015-33 pp.13-18 |
| EMCJ | 2015-07-09 11:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Measurement Method for Induced Current under Radiated Immunity Test Yasunori Oguri, Kenji Sogo, Seiji Nagakusa, Makoto Tanaka (DENSO) EMCJ2015-34 |
The EO/OE converter and the optical fiber cable is used to measure induced current on the wire harness under radiated im... [more] | EMCJ2015-34 pp.19-23 |
| EMCJ | 2015-07-09 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Development of Pseudo Myoelectric Signal Generator and ESD Test Evaluation for Artificial Arm Keisuke Sato, Daisuke Anzai, Jianqing Wang, Osamu Fujiwara (NIT) EMCJ2015-36 |
In this study, we developed a pseudo myoelectric signal generator for immunity test of arti cial arm.As an example, we a... [more] | EMCJ2015-36 pp.31-35 |
| EMCJ, IEE-EMC, IEE-MAG | 2015-06-26 15:20 |
Overseas | KMITL, Thailand | Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-30 |
In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a ... [more] | EMCJ2015-30 pp.73-78 |
| EMCJ | 2015-03-06 16:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Special Talk]
Outline of the progress relating to establishment and revision of EMC standards for Information Technology Equipment Fujio Amemiya (NTT AT) EMCJ2014-110 |
So many requirements shown in such EMC standards for Information Technology Equipment as CISPR 22 and CISPR 24 have been... [more] | EMCJ2014-110 pp.47-50 |
| EMCJ, PEM (Joint) |
2014-11-14 15:15 |
Tokyo | AIST Tokyo Waterfront | A Study of Electrostatic Discharge Immunity Testing for Wearable Equipment Takeshi Ishida (Noiseken/UEC), Fengchao Xiao, Yoshio Kami, Osamu Fujiwara, Shuichi Nitta (UEC) EMCJ2014-72 |
The electrostatic discharge (ESD) immunity test for electronic equipment is specified in the international standard IEC ... [more] | EMCJ2014-72 pp.31-35 |
[Return to Top Page]