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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, IEE-EMC, IEE-SPC | 2023-05-12 17:20 |
Okinawa | (Primary: On-site, Secondary: Online) |
Fault Location using Deep Learning for TDR Waveforms in Overhead Distribution Systems with Few Branches Tohlu Matsushima, Daiki Nagata, Yuki Fukumoto (Kyutech), Takashi Hisakado (Kyoto Univ), Uki Kanenari, Tsuyoshi Iinuma, Yusuke Nishihiro (Kansai Transmission and Distribution, Inc.), Shin Toguchi (DAIHEN Corporation)  EMCJ2023-11 |
Equipment using the TDR method is being developed to accelerate detection of faults in overhead distribution systems. H... [more] |
EMCJ2023-11 pp.25-30 |
| HWS | 2023-04-14 14:45 |
Oita | (Primary: On-site, Secondary: Online) |
Exploration of analysis methods of electromagnetic fault injection attacks on cryptographic IC chips Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-4 |
There are various methods of fault injection attacks on cryptographic IC chips, such as lasers and electromagnetic waves... [more] | HWS2023-4 pp.11-15 |
| HWS | 2023-04-14 15:10 |
Oita | (Primary: On-site, Secondary: Online) |
Electromagnetic fault injection attacks on cryptographic IC chips and analysis of internal voltage fluctuation Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ) HWS2023-5 |
Cryptographic IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions through in... [more] | HWS2023-5 pp.16-19 |
| HWS | 2023-04-14 15:35 |
Oita | (Primary: On-site, Secondary: Online) |
Object Generation - Backdoor Attack against Object-Detection DNN Triggered by Fault Injection into MIPI Takumi Takubo, Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2023-6 |
Backdoor attacks that induce misclassification by poisoning training data and adding specific patterns (trigger marks) t... [more] | HWS2023-6 pp.20-25 |
| ICM | 2023-03-17 13:55 |
Okinawa | Okinawa Prefectural Museum and Art Museum (Primary: On-site, Secondary: Online) |
[Encouragement Talk]
Proposal of graph data conversion of system monitoring data and its utilization method Masashi Sugimoto, Ryoma Takemura, Soma Murata, Ryo Sasaki, Kenta Oonoki (NTTCW) ICM2022-58 |
We have proposed a method to link data managed in a relational database with a graph database in real time and to utiliz... [more] | ICM2022-58 pp.89-94 |
| ICM | 2023-03-17 14:15 |
Okinawa | Okinawa Prefectural Museum and Art Museum (Primary: On-site, Secondary: Online) |
Study and applicability evaluation of autonomous estimation for network failure Fumika Asai, Li Di, Norio Yamamoto, Haruhisa Nozue, Kenichi Tayama (NTT) ICM2022-59 |
With the recent large-scale network failures, rapid identification of suspected fault points and service recovery are be... [more] | ICM2022-59 pp.95-100 |
| RCS, SR, SRW (Joint) |
2023-03-02 10:50 |
Tokyo | Tokyo Institute of Technology, and Online (Primary: On-site, Secondary: Online) |
A Numerical Study of Quantum Speedup for Maximum Likelihood Detection of Power-Domain NOMA Masaya Norimoto, Naoki Ishikawa (Yokohama National Univ.) SR2022-86 |
We investigate whether a quantum exhaustive search algorithm, Grover adaptive search (GAS), provides quadratic speedup i... [more] | SR2022-86 pp.11-15 |
| HWS, VLD | 2023-03-04 10:00 |
Okinawa | (Primary: On-site, Secondary: Online) |
Importance of Inverters Placement in Ring-Oscilator for Laser Irradiation Detection Shungo Hayashi (YNU), Junichi Sakamoto (AIST/YNU), Masaki Chikano, Tsutomu Matsumoto (YNU) VLD2022-115 HWS2022-86 |
Laser fault injection is known as the most efficient fault injection technique due to its high spatial controllability a... [more] | VLD2022-115 HWS2022-86 pp.233-238 |
| DC | 2023-02-28 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.) DC2022-83 |
(To be available after the conference date) [more] | DC2022-83 pp.6-11 |
| DC | 2023-02-28 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST Yangling Xu, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (KSU) DC2022-89 |
With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern very large integrat... [more] | DC2022-89 pp.39-44 |
| MSS, SS | 2023-01-10 14:30 |
Osaka | (Primary: On-site, Secondary: Online) |
Toward Automatic Generation of an Optimal Supervision Tree in Erlang Shoichi Sasaki, Yoshiaki Takata (KUT) MSS2022-46 SS2022-31 |
Erlang is a concurrency-oriented functional programming language that comes standard with lightweight processes that are... [more] | MSS2022-46 SS2022-31 pp.7-12 |
| MSS, SS | 2023-01-11 13:55 |
Osaka | (Primary: On-site, Secondary: Online) |
MSS2022-57 SS2022-42 |
(To be available after the conference date) [more] | MSS2022-57 SS2022-42 pp.72-77 |
| CPSY, IPSJ-ARC | 2023-01-10 14:40 |
Online | Online | Survay of the Relationship between the Number of Page Faults and UX on PC Usage Shodai Masaki, Hayato Nomura (NITAC) CPSY2022-29 |
With the goal of developing software that can detect PC operating speed degradation, performance shortages, and the need... [more] | CPSY2022-29 pp.13-14 |
| DC | 2022-12-16 13:10 |
Yamaguchi | (Primary: On-site, Secondary: Online) |
On Improving the Accuracy of LSI Small Delay Fault Diagnosis Shinnosuke Fujita, Stefan Holst, Xiaoqing Wen (Kyutech) DC2022-72 |
With today's tight timing margins, increasing manufacturing variation, and the development of nanometer technology, timi... [more] | DC2022-72 pp.1-6 |
| DC | 2022-12-16 13:50 |
Yamaguchi | (Primary: On-site, Secondary: Online) |
Evaluation of Fault Tolerance in Stochastic Computing Based Neural Network Inference Accelerators Ryoga Nagashima, Stefan Holst, Xiaoqing Wen (Kyutech) DC2022-74 |
In recent years, neural networks have become increasingly complex. Stochastic computing (SC) techniques are currently be... [more] | DC2022-74 pp.12-16 |
| DC | 2022-12-16 14:10 |
Yamaguchi | (Primary: On-site, Secondary: Online) |
Stuck-at Fault Tolerance in DNN Using Outliers and Sampling Tomohiro Ishii, Kazuteru Namba (Chiba Univ.) DC2022-75 |
The development of artificial intelligence and the expansion of big data have led to the implementation of neural networ... [more] | DC2022-75 pp.17-20 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2022-11-30 14:45 |
Kumamoto | (Primary: On-site, Secondary: Online) |
Evaluation of testing TSVs using the delay testable circuit implemented in a 3D IC Keigo Takami (Tokushima Univ. Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2022-47 ICD2022-64 DC2022-63 RECONF2022-70 |
Testing TSVs used for chip-to-chip interconnection in 3D stacked ICs is a challenging problem. We have proposed a bounda... [more] | VLD2022-47 ICD2022-64 DC2022-63 RECONF2022-70 pp.162-167 |
| R | 2022-11-17 14:25 |
Online | Online | Optimal Maintenance Interval for DU Fault of Safety-Related System Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) R2022-41 |
IEC 61508 is known as the basic international standard for the functional safety of electrical / electronic / programmab... [more] | R2022-41 pp.7-12 |
| HWS, ICD | 2022-10-25 13:50 |
Shiga | (Primary: On-site, Secondary: Online) |
Fundamental Study of Adversarial Examples Created by Fault Injection Attack on Image Sensor Interface Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2022-36 ICD2022-28 |
Adversarial examples (AEs), which cause misclassification by adding subtle perturbations to input images, have been prop... [more] | HWS2022-36 ICD2022-28 pp.35-40 |
| ICD, SDM, ITE-IST [detail] | 2022-08-08 15:20 |
Online | Evaluation of IC Chip Response by Backside Voltage Disturbance in Flip Chip Packaging Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2022-40 ICD2022-8 |
Flip chip packaging has become a general technique for mounting semiconductor ICs due to the need for smaller area. Howe... [more] | SDM2022-40 ICD2022-8 pp.27-30 |
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