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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| NLP |
2006-05-11
12:30 |
Kumamoto |
Kumamoto Univ. |
A Study on Test Pattern Generation for LSI Tests Using Chaotic Sequences
Atsushi Izukura, Ryusuke Tsuchida, Kunihiko Kudou, Daisaburo Yoshioka, Akio Tsuneda, Takahiro Inoue (Kumamoto Univ.) |
Linear feedback shift registers (LFSRs) are extensively used in built-in self-test (BIST) as a test pattern generator (T... [more] |
NLP2006-1
pp.1-4 |
| CAS |
2006-01-12
17:15 |
Miyazaki |
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Correlation Properties of Orthogonal Sequences Generated by Nonlinear Shift Registers
Akio Tsuneda, Yoshinori Higa, Daisaburo Yoshioka, Takahiro Inoue (Kumamoto Univ.) |
Nonlinear feedback shift registers (NFSRs) can be regarded as finite-bit-approximations of Bernoulli and tent maps which... [more] |
CAS2005-86
pp.67-72 |
| IT |
2005-09-27
14:45 |
Fukushima |
Aizu Univ. |
A consideration on maximum-likelihood decoding for Reed-Solomon codes
Muneyuki Shotsu (Shinshu Univ.), Masazumi Kurihara (Univ. of Electro-Com.), Tatsuo Sugimura (Shinshu Univ.) |
In the report, the efficient method of maximum-likelihood decoding for Reed-Solomon(R-S) code is proposed. The maximum-l... [more] |
IT2005-54
pp.19-24 |
| ICD, CPM |
2005-01-28
15:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Selection of Seeds and Phase Shifters for Scan BIST
Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
In this paper, we discuss the application of a seed-selection procedure for LFSR-based BIST to multiple scan chains, com... [more] |
CPM2004-171 ICD2004-216
pp.53-58 |
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