Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
AP, MW (Joint) |
2011-03-04 10:20 |
Ibaraki |
Ibaraki Univ. |
Study on diamond thin film semiconducting devices for application to a development of hard-electronics high frequency driving circuit Jeong-Gab Ju, Young-Bae Park, Bo-Ra Jung, Jang-Hyeon Jeong, Eui-Hoon Jang, Suk-Youb Kang, Young Yun (Korea Maritime Univ.) MW2010-166 |
In this paper, basic electrical properties of semiconducting diamond were investigated in order to check its capability ... [more] |
MW2010-166 pp.83-85 |
NC, NLP |
2011-01-25 15:35 |
Hokkaido |
Hokakido Univ. |
[Invited Talk]
Neuromorphic Microelectronics
-- From Devices to Hardware Systems and Applications -- Alexandre Schmid (Swiss Federal Inst. of Tech. EPFL) NLP2010-152 NC2010-116 |
The development of Neuromorphic micrcoelectronic systems has followed the advances in computational biology as well as p... [more] |
NLP2010-152 NC2010-116 pp.159-164 |
OFT |
2010-10-25 14:25 |
Saitama |
Nippon Institute of Technology |
Development and transmission quality estimation of a new optical frequency resource of the T-band for ultra-broadband holey-fiber photonic transport system Yu Omigawa, Yuta Kinoshita, Kazuyuki Yamamoto (Aoyama Gakuin Univ.), Naokatsu Yamamoto, Atsushi Kanno, Kouichi Akahane, Tetsuya Kawanishi (NICT), Hideyuki Sotobayashi (Aoyama Gakuin Univ.) OFT2010-33 |
To expand the usable wavelength bandwidth for optical communications, we have focused on a use of a 1-micrometer wavelen... [more] |
OFT2010-33 pp.25-28 |
ED, SDM |
2010-07-02 16:15 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
Study on Collective Electron Motion in Si-Nano Dot Floating Gate MOS Capacitor Masakazu Muraguchi (Tohoku Univ.), Yoko Sakurai, Yukihiro Takada, Shintaro Nomura, Kenji Shiraishi (Univ. of Tsukuba.), Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki (Hiroshima Univ.), Yasuteru Shigeta (Univ. of Hyogo), Tetsuo Endoh (Tohoku Univ.) ED2010-122 SDM2010-123 |
The efficiency and stability of electron injection from the electrode to the nano-structure is one of the most important... [more] |
ED2010-122 SDM2010-123 pp.319-324 |
EMCJ |
2008-12-19 13:25 |
Gifu |
Gifu Univ. |
[Special Talk]
EMC Surroundings and Evaluation of Automotive Electronic Components Michihira Iida, Masato Izumichi (DENSO CORPORATION) EMCJ2008-94 |
The number of electronics components are increasing, realizing the recent demand for cars, such as IT (Information Techn... [more] |
EMCJ2008-94 pp.45-50 |
EMD |
2008-11-15 11:00 |
Miyagi |
Tohoku Bunka Gakuin University (Sendai) |
Improvement in parameters of older construction power contactors by modernization of their drivers Piotr Borkowski, Grzegorz Drygala (Tech. Univ. of Lodz) EMD2008-70 |
In practice there are cases when electrical apparatuses available on the market do not fully comply with requirements st... [more] |
EMD2008-70 pp.21-24 |
ED |
2008-08-04 16:10 |
Shizuoka |
Sizuoka Univ. Hamamatsu Campus |
Report of the Ninth IEEE International Vacuum Elecronics Conference(IVE2008) Takao Kageyama (FAIS) ED2008-116 |
This paper reports recent R&D activities on Vacuum Electronics including design, component and production technologies. ... [more] |
ED2008-116 pp.35-38 |
OPE, LQE |
2008-06-27 15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
[Invited Talk]
Report on CLEO2008 Tetsuya Kawanishi (NICT) OPE2008-26 LQE2008-27 |
This paper reports on CLEO 2008 held at San Jose Convention Center, CA, USA, from 4th to 9th May. We focus on technical ... [more] |
OPE2008-26 LQE2008-27 pp.39-42 |
ET |
2008-03-08 14:05 |
Tokushima |
Tokushima Univ. |
Hands-on study based on self-organizing activities of electronics-circuit building Mariko Yao, Junichi Akita (Kanazawa Univ.) ET2007-91 |
Recently, the students in electronic engineering courses are expected to acquire expert knowledge as well as nurture cre... [more] |
ET2007-91 pp.41-46 |
CPM, ICD |
2008-01-18 16:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Reliability evaluation of lead free solder joint against vibration load under thermal circumstance Michiya Matsushima (Osaka Univ.), Toshiyuki Hamano (ESPEC), Kiyokazu Yasuda, Kozo Fujimoto (Osaka Univ.) CPM2007-148 ICD2007-159 |
The reliability of electronics solder joints is evaluated for each individual stress even if the electronics devices are... [more] |
CPM2007-148 ICD2007-159 pp.117-122 |
MoNA, IN (Joint) |
2007-11-15 16:30 |
Fukuoka |
Fukuoka Institute of Technology |
[Invited Talk]
Invited Talk Motoharu Miyake, Takashi Yoshikawa, Masaharu Nakatsuchi, Atsushi Takeshita (NTT DoCoMo) IN2007-93 MoMuC2007-56 |
Specifications for sharing digital content (images, music and video) using consumer electronics, personal computers and ... [more] |
IN2007-93 MoMuC2007-56 pp.25-30(IN), pp.1-6(MoMuC) |
ED, SDM |
2007-06-25 13:00 |
Overseas |
Commodore Hotel Gyeongju Chosun, Gyeongju, Korea |
[Keynote Address]
Aspect of SiC R&D in Japan Kazuo Arai (AIST) |
SiC power devices is expecting to be industrialized as soon as possible in view of energy saving. In this presentation t... [more] |
|
ED |
2006-08-03 16:30 |
Osaka |
Osaka Univ. Convention Center |
TFT-controlled FED Masayoshi Nagao, Chiaki Yasumuro, Yuuichi Sakamura, Seigo Kanemaru, Junji Itoh (AIST) |
Thin-film transistor-controlled field-emission display (TFT-controlled FED) was fabricated. Each pixel of the FED has fi... [more] |
ED2006-126 pp.47-52 |