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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 45  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
WPT 2024-03-15
09:10
Kyoto Kyoto-Univ. (Uji campus)
(Primary: On-site, Secondary: Online)
Novel Microwave Snow Melting Waveguide Utilizing EBG to Prevent Electromagnetic Leakage
Koyo Hatazawa, Tamami Maruyama, Akari Kamada, Noa Ebita, Takahiko Nakamura (NIT, Hakodate College), Tsunayuki Yammoto, Nanami Kobayakawa, Fuka Yoshii, Yuna Higasa (NIT, Tsuyama College), Masashi Nakatsugawa (NIT, Hakodate College), Manabu Omiya (Hokkaido University) WPT2023-46
This paper introduces a novel snow melting method that involves directing microwaves onto snow without outward electroma... [more] WPT2023-46
pp.59-62
VLD, HWS, ICD 2024-02-29
15:55
Okinawa
(Primary: On-site, Secondary: Online)
[Memorial Lecture] Modeling of Tamper Resistance to Electromagnetic Side-channel Attacks on Voltage-scaled Circuits
Kazuki Minamiguchi, Yoshihiro Midoh, Noriyuki Miura, Jun Shiomi (Osaka Univ.) VLD2023-117 HWS2023-77 ICD2023-106
The threat of information leakage by Side-Channel Attacks (SCAs) using ElectroMagnetic (EM) leakage is becoming more and... [more] VLD2023-117 HWS2023-77 ICD2023-106
p.99
MW, EMCJ, EST, IEE-EMC [detail] 2023-10-19
10:10
Yamagata Yamagata University
(Primary: On-site, Secondary: Online)
A study of undesired emission from a grounded coplanar line
Yuki Nakashima, Teruo Tobana, Kohei Akimoto (Akita Prefectural Univ.) EMCJ2023-38 MW2023-92 EST2023-65
Undesired electromagnetic radiation from electronic devices is a serious problem because it causes performance degradati... [more] EMCJ2023-38 MW2023-92 EST2023-65
pp.18-21
MW, EMCJ, EST, IEE-EMC [detail] 2023-10-20
15:30
Yamagata Yamagata University
(Primary: On-site, Secondary: Online)
Effect of Increased Number of Disturbance Sources on the Setting of Emission Limits -- Limit Setting Based on Field Strength Distribution of the Strongest Disturbance --
Yasushi Matsumoto, Ifong Wu, Kaoru Gotoh, Yukio Yamanaka (NICT) EMCJ2023-68 MW2023-122 EST2023-95
The effect of the increased number of electromagnetic disturbance sources on the setting of emission limits for radio pr... [more] EMCJ2023-68 MW2023-122 EST2023-95
pp.170-175
EST, MW, EMT, OPE, MWPTHz, IEE-EMT [detail] 2023-07-20
10:00
Hokkaido Muroran Institute of Technology
(Primary: On-site, Secondary: Online)
Simulation of ULF emissions in the Earth's crust by 3-D WLP-FDTD method
Rinako Shinno, Yoshiaki Ando (UEC) EMT2023-11 MW2023-29 OPE2023-11 EST2023-11 MWPTHz2023-7
After the 1990s, there are some reports that ULF electromagnetic emissions were observed with seismic activities. To ana... [more] EMT2023-11 MW2023-29 OPE2023-11 EST2023-11 MWPTHz2023-7
pp.11-15
EMCJ, IEE-EMC, IEE-SPC 2023-05-12
13:15
Okinawa  
(Primary: On-site, Secondary: Online)
Evaluating Transmission Efficiency Impact on Screen Reconstruction Accuracy for High-Resolution Displays
Taiki Kitazawa, Yuichi Hayashi (NAIST) EMCJ2023-6
In TEMPEST attacks targeting high-resolution displays with divided screens, reconstructing screen information proves dif... [more] EMCJ2023-6
pp.1-6
EMCJ, MW, EST, IEE-EMC [detail] 2022-10-13
09:30
Akita Akita University
(Primary: On-site, Secondary: Online)
Fundamental research on analysis of electromagnetic radiation from coplanar transmission lines
Yuki Nakashima, Teruo Tobana, Kohei Akimoto (Akita Prefectural Univ.) EMCJ2022-36 MW2022-82 EST2022-46
Undesired electromagnetic radiation from electronic devices is a serious problem because it causes performance degradati... [more] EMCJ2022-36 MW2022-82 EST2022-46
pp.6-10
EMCJ, MW, EST, IEE-EMC [detail] 2022-10-14
15:35
Akita Akita University
(Primary: On-site, Secondary: Online)
Results of EMC round robin test on emission and immunity test -- (4) Experimental results of 1-6 GHz radiated immunity round-robin test --
Yasushi Asaji (Murata Manufacturing), Hironobu Matsuyama (KEC Kansai Electronic Industry Development Center), Toshiyasu Tanaka (Microwave Factory), Hirotsugu Hashimoto (RES), Ryosuke Nakao (COSEL), Kazusa Tanaka (ADOX Fukuoka), Takuya Yamada (FUJIFILM Business Innovation) EMCJ2022-61 MW2022-107 EST2022-71
In the previous report, we conducted interlaboratory comparison regarding to 80 MHz to 1 GHz radiated electromagnetic fi... [more] EMCJ2022-61 MW2022-107 EST2022-71
pp.130-135
EMCJ 2022-06-10
09:55
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Time Domain Analysis of Emission Noise from Drone and Evaluation of Interference with Cellular Systems.
Ryota Sakai, Koh Watanabe, Satoshi Tanaka, Makoto Nagata (Kobe Univ.) EMCJ2022-16
Drones are expected to be used in industrial applications. Within the small fuselage of a drone, various electronic modu... [more] EMCJ2022-16
pp.11-14
EMCJ 2022-05-20
15:00
Kyoto Campus Plaza Kyoto
(Primary: On-site, Secondary: Online)
Statistical model for the estimation of emission limit for protecting radio services
Yasushi Matsumoto, Kaoru Gotoh, Yukio Yamanaka (NICT) EMCJ2022-11
It is necessary to define appropriate emission limits to ensure that electromagnetic disturbances unintentionally radiat... [more] EMCJ2022-11
pp.16-21
VLD, HWS [detail] 2022-03-08
16:10
Online Online Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables -- Impact of Modulation Factor and Emission Intensity --
Taiga Yukawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-103 HWS2021-80
The threats of electromagnetic (EM) information leakage caused by hardware Trojans (HTs) implemented on signal cables ha... [more] VLD2021-103 HWS2021-80
pp.153-157
EMCJ 2020-07-02
15:20
Online Online Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference
Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the dev... [more] EMCJ2020-15
pp.25-28
HWS, VLD 2019-02-28
16:45
Okinawa Okinawa Ken Seinen Kaikan Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations
Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83
There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause ser... [more] VLD2018-120 HWS2018-83
pp.163-167
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
14:35
Hiroshima Satellite Campus Hiroshima Analysis of Conductive Power Noise Characteristics in Digital IC Chips between two Different IC Packaging Structures
Akihiro Tsukioka, Kosuke Jike, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ.) CPM2018-96 ICD2018-57 IE2018-75
The conducted and radiated emission are caused by the dynamic power consumption in digital circuit operations. The chara... [more] CPM2018-96 ICD2018-57 IE2018-75
pp.37-42
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
15:10
Overseas KAIST [Poster Presentation] An Electromagnetic Field Reduction Method for Inductive Power Transfer in Transportation System
Jedok Kim, Seungyoung Ahn (KAIST) EMCJ2018-75
Currently, charging electric transportation systems with wireless power transfer (WPT) technologies are drawing strong a... [more] EMCJ2018-75
p.53
EMCJ 2018-01-19
09:55
Okayama   Determination of High Priority Countermeasures to Reduce Electromagnetic Interference by Using Noise Source Amplitude Modulation and Evaluation of its Effect
Shinpei Yoshino, Chiaki Ishida, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2017-96
For low cost determination of noise sources to reduce electromagnetic interference (EMI) , we have proposed a method nam... [more] EMCJ2017-96
pp.49-54
EMCJ 2017-11-22
14:15
Tokyo Kikai-Shinko-Kaikan Bldg. Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI
Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-71
The intentional electromagnetic interference (IEMI) fault-injection method generates a fault by injecting a glitch into ... [more] EMCJ2017-71
pp.41-44
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-07
14:55
Kumamoto Kumamoto-Kenminkouryukan Parea Simulation Techniques for EMC Compliant Design of Automotive IC Chips and Modules
Akihiro Tsukioka, Makoto Nagata, Kohki Taniguchi, Daisuke Fujimoto (Kobe Univ.), Rieko Akimoto, Takao Egami, Kenji Niinomi, Takeshi Yuhara, Sachio Hayashi (TOSHIBA), Rob Mathews, Karthik Srinivasan, Ying-Shiun Li, Norman Chang (ANSYS) CPM2017-84 ICD2017-43 IE2017-69
In recent years, electromagnetic compatibility (EMC) becomes a major concern among IC chips. EMC is characterized in two... [more] CPM2017-84 ICD2017-43 IE2017-69
pp.27-32
EMCJ 2017-01-19
14:05
Fukuoka Kyushu Institute of Technology Evaluation of Unintended electromagnetic radiation from Myoelectric Artificial Hand
Yoshitaka Toyota (Okayama Univ.) EMCJ2016-111
At this moment, there are no limits nor methods of the emission measurements for wearable electronic and robotic equipme... [more] EMCJ2016-111
pp.15-18
EMCJ 2016-11-25
10:30
Tokyo Kikai-Shinko-Kaikan Bldg. Radiated Emission Analysis with Electromagnetic Simulation for Printed Circuit Boards
Kodai Katagiri, Norihiko Akashi, Sotome Hideyuki, Takaya Muto (Mitsubishi Electric Corp.) EMCJ2016-89
It is necessary to design printed circuit boards of the electronic equipment in consideration of restraining radiated em... [more] EMCJ2016-89
pp.7-11
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