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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| LQE, CPM, EMD, OPE, R | 2012-08-23 14:15 |
Miyagi | Tohoku Univ. | Improvement in reliability of AlGaInAs edge-emitting laser diodes Hiroyuki Ichikawa, Yasuo Yamasaki, Nobuyuki Ikoma (SEI)  R2012-27 EMD2012-33 CPM2012-58 OPE2012-65 LQE2012-31 |
High-speed and high-temperature operations are required for light emitters in optical communication systems. AlGaInAs la... [more] | R2012-27 EMD2012-33 CPM2012-58 OPE2012-65 LQE2012-31 pp.33-36 |
| EMCJ, IEE-EMC | 2012-06-22 15:25 |
Osaka | Osaka Univ. | Charging voltage and propagation distance dependences of the UHF band electromagnetic waves emitted at the operation of electrostatic discharge test equipment and standard lightning impulse voltage generator Toshitake Umegane, Hiroki Shibata, Shinya Ohtsuka (KIT) EMCJ2012-30 |
Electromagnetic waves emitted from the impulse voltage generators such as a standard lightning impulse generator for hig... [more] | EMCJ2012-30 pp.53-56 |
| SANE | 2012-05-18 13:50 |
Kanagawa | National Defense Academy of Japan | Electronic Warfare and Electronic Technology for it:A view from Defense Science and Technology Masaaki Kobayashi (Mitsubishi Electric) SANE2012-15 |
Electronic warfare (EW) referred to as any military action involving the use of electromagnetic waves is becoming import... [more] | SANE2012-15 pp.25-30 |
| RCS, SIP | 2012-01-27 13:55 |
Fukuoka | Fukuoka Univ. | OPTIMIZATION OF INTERFERENCE SIGNALS TO AN EAVESDROPPER WITH MULTIPLE ANTENNAS Shuiqiang Yan, Shuichi Ohno (Hiroshima Univ.), Yuji Wakasa (Yamaguchi Univ.) SIP2011-110 RCS2011-299 |
Wireless communications are susceptible to eavesdropping. To interfere the eavesdropper having multiple antennas,secret ... [more] | SIP2011-110 RCS2011-299 pp.183-186 |
| EMCJ, IEE-EMC | 2011-10-28 10:35 |
Aomori | Hachinohe Grand Hotel | Variations of radiated electromagnetic field due to low voltage ESD in spherical electrode. Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (TGU), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2011-81 |
Amplitude properties of radiated electromagnetic field caused by low voltage ESD (electrostatic discharge) in spherical ... [more] | EMCJ2011-81 pp.1-4 |
| COMP | 2011-06-30 13:00 |
Hiroshima | Hiroshima Univ. | Absolutely Secure Message Transmission Using a Key Sharing Graph Yoshihiro Indo (Kwansei Gakuin Univ.), Takaaki Mizuki (Tohoku Univ.), Takao Nishizeki (Kwansei Gakuin Univ.) COMP2011-18 |
Assume that there are players and an eavesdropper of unlimited computational power and that several pairs of players hav... [more] | COMP2011-18 pp.17-23 |
| NC, MBE (Joint) |
2011-03-07 14:35 |
Tokyo | Tamagawa University | Analyzing read-out pattern from brain neuronal network based on loop circuit hypothesis Yoshi Nishitani (Osaka Univ), Chie Hosokawa (AIST), Shinichi Tamura (Osaka Univ) NC2010-144 |
We consider that the memory is composed of loop neural circuit in the cerebral cortex. We have already shown a feasibili... [more] | NC2010-144 pp.101-106 |
| EMCJ, IEE-EMC | 2010-12-10 14:05 |
Aichi | Chukyo Univ. Toyoda Campus | An Immunity Test Method Insensitive to Arrangements of Equipment Under Test for Indirect Discharges of ESD-Gun onto Tapered Vertical Coupling Plane Takuro Tsuji, Kouji Himeno (NIT), Yoshinori Taka (KNCT), Osamu Fujiwara (NIT) EMCJ2010-92 |
International Electrotechnical Commission (IEC) prescribes immunity tests (IEC61000-4-2) of electronic equipment against... [more] | EMCJ2010-92 pp.63-67 |
| LQE, OPE, OCS | 2010-10-29 15:30 |
Fukuoka | Mojiko Retro Town, Minato house | High Reliable AlGaInAs Lasers by Improved Facet-Coating Processes Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Nobuyuki Ikoma (SEI) OCS2010-83 OPE2010-119 LQE2010-92 |
AlGaInAs lasers are suitable for element devices of optical communication systems. However, degradations in forward-bias... [more] | OCS2010-83 OPE2010-119 LQE2010-92 pp.157-162 |
| CAS (2nd) |
2010-10-06 09:45 |
Chiba | Makuhari Messe | [Invited Talk]
Impact of DFR simulation from device to circuit Kazuya Matsuzawa, Daisuke Hagishima, Takamitsu Ishihara (Advanced LSI Technology Lab. TOSHIBA) |
Long term-reliability must be considered in the value of LSI as well as function and performance. Conventionally, the LS... [more] | |
| EMCJ, EMD | 2010-07-16 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | ESD waveform measurement with current probe and optical voltage probe Mikiya Iida (Toshiba Corp.) EMCJ2010-36 EMD2010-21 |
ESD causes the malfunction of an electronic equipment. In order to clarify the ESD influence to malfunction mechanism, i... [more] | EMCJ2010-36 EMD2010-21 pp.25-30 |
| EMCJ (2nd) |
2010-05-28 14:00 |
Miyagi | Cyberscience Center, Tohoku University | Measurement of the radiated electromagnetic filed intensity using spherical electrodes and a horn antenna Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (NIT) |
The micro-gap discharge as the low voltage ESD shows very fast transition duration of about 32 ps or less. Besides, brea... [more] | |
| EMCJ (2nd) |
2010-05-28 14:40 |
Miyagi | Cyberscience Center, Tohoku University | Frequency Spectra and Their Uncertainty of Discharge Currents for Contact Discharges of ESD-Gun Yoshinori Taka, Fumihiko Toya, Osamu Fujiwara (NIT) |
International Electrotechnical Commission (IEC) has prescribed an immunity test (IEC61000-4-2) of electronic equipment a... [more] | |
| EMCJ | 2010-04-23 14:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Wideband Measurement of Radiated Electromagnetic Field Intensity due to the low voltage ESD Ken Kawamata (HIT), Shigeki Minegishi (TGU), Osamu Fujiwara (NIT) EMCJ2010-9 |
The breakdown voltage and radiated electromagnetic field intensity due to micro gap discharge were examined in experimen... [more] | EMCJ2010-9 pp.45-48 |
| EMCJ | 2010-01-22 10:55 |
Okinawa | University of the Ryukyus | Effects on Discharge Current Wave and Their Frequency Spectra of Built-In Inductor for Contact Discharge of ESD-Gun Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-115 |
International Electrotechnical Commission (IEC) has prescribed an immunity test (IEC61000-4-2) of electronic equipment a... [more] | EMCJ2009-115 pp.99-103 |
| EMCJ, IEE-EMC | 2009-12-18 13:25 |
Gifu | NIFS | Representation of Equivalent Circuit to Estimate Injected Currents for Contact Discharge of ESD-Generators Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-93 |
International electrotechnical commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] | EMCJ2009-93 pp.49-53 |
| EMCJ, IEE-EMC | 2009-12-18 13:50 |
Gifu | NIFS | Frequency Spectra and Their Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Generators Yoshinori Taka, Fumihiko Toya, Osamu Fujiwara (Nagoya Inst. of Tech.) |
International Electrotechnical Commission (IEC) has prescribed an immunity test (IEC61000-4-2) of electronic equipment a... [more] | EMCJ2009-94 pp.55-58 |
| EMCJ, IEE-EMC | 2009-12-18 14:15 |
Gifu | NIFS | Study on Radiated Electromagnetic Field Intensity due to Micro Gap Discharge as the low voltage ESD. Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) |
The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in ex... [more] | EMCJ2009-95 pp.59-64 |
| EMCJ, MW, IEE-MAG | 2009-10-22 10:40 |
Iwate | Iwate Univ. | [Special Talk]
Speculate on EMC/ESD
-- Discover New Things By Learning from the Past -- Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-45 MW2009-94 |
Before the concept of electromagnetic compatibility (ESD) was established in the Unite States of America more than fifty... [more] | EMCJ2009-45 MW2009-94 pp.7-12 |
| AP | 2009-09-04 14:50 |
Aomori | Hachinohe Inst. of Tech. | Experimental Study of Radiated Electromagnetic Field Intensity due to Micro Gap Discharge Ken Kawamata (Hachinohe Inst. of Tech.), Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) AP2009-100 |
The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in ex... [more] | AP2009-100 pp.121-124 |
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