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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, IEE-SPC (Joint) |
2017-06-05 13:55 |
Hokkaido |
Sapporo Convention Center |
Improved shunt-type AAN and its characteristics Takashi Shinozuka, Katsumi Fujii (NICT), Kazuhiro Takaya, Yoshiharu Akiyama (NTT), Akira Sugiura, Osami Wada (Kyoto Univ.) EMCJ2017-23 |
(To be available after the conference date) [more] |
EMCJ2017-23 pp.13-18 |
EMCJ |
2015-09-04 15:45 |
Kyoto |
Keihanna Plaza |
[Invited Lecture]
Introduction of KEC striving for the contribution to the development of the electronics industry.
-- From Training engineers to the state-of-the-art EMC Testing facilities. -- Kenji Masaoka, Kazuo Ogasawara (KEC) EMCJ2015-58 |
KEC Electronic Industry Development Center was established in 1961 under the support of Ministry of Economy, Trade and I... [more] |
EMCJ2015-58 pp.31-35 |
EMCJ |
2009-09-04 13:25 |
Kyoto |
KEIHANNA PLAZA |
[Special Talk]
ISO/IEC 17025 Laboratory Accreditation scheme and its application to EMC laboratory Koichi Sazanami (JAB) EMCJ2009-43 |
In EMC testing, measurement uncertainty is large, and sometimes reliability of test report is suspicious. In this case, ... [more] |
EMCJ2009-43 pp.47-52 |
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