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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, IEE-EMC, IEE-MAG 2015-06-26
15:20		 Overseas KMITL, Thailand Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance
Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-30		 In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a ... [more] EMCJ2015-30
pp.73-78
EMCJ 2013-04-12
13:45		 Okayama Okayama Univ. Improvement of Reproducibility of DPI Method to Quantify RF Conducted Immunity of Voltage Regulator
Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2013-4		 In recent years, immunity of a voltage regulator which supplies constant voltage to electronic circuits becomes
increas... [more]		 EMCJ2013-4
pp.19-24
EMCJ 2004-12-10
16:15		 Aichi Nagoya Institute of Technology A Study on Measurement of LSI Immunity for PCB Analysis
Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology) 		We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyz... [more]		 EMCJ2004-115
pp.77-82
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