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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 38  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2021-07-20
15:55
Online online Evaluation of TRNG Using CMOS Image Sensor
Hayato Tatsuno, Tatsuya Oyama, Masayoshi Shirahata, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.)
(To be available after the conference date) [more]
HWS, VLD [detail] 2021-03-04
13:00
Online Online Design of Area-Efficient Response Generator for CMOS Image Sensor PUF
Masanori Aoki, Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) VLD2020-82 HWS2020-57
(To be available after the conference date) [more] VLD2020-82 HWS2020-57
pp.79-84
SANE 2021-01-29
11:20
Online Online Development of high-sensitivity camera for space using consumer parts
Fumiya Kuramoto, Shinichi Kimura (TUS) SANE2020-48
The highly sensitive images in space has very important implications in various aspects such as scientific observations ... [more] SANE2020-48
pp.56-60
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-18
09:55
Online Online Column-Parallel Pipelined ADC with Ring Amplifier for High Speed and High Spatial Resolution CMOS Image Sensor
Takashi Kojima (TUS), Toshinori Otaka, Yusuke Kameda, Takayuki Hamamoto (TUS) VLD2020-28 ICD2020-48 DC2020-48 RECONF2020-47
CMOS image sensor that can capture images with both high time resolution and high spatial resolution is required for ins... [more] VLD2020-28 ICD2020-48 DC2020-48 RECONF2020-47
pp.101-105
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
09:40
Ehime Ehime Prefecture Gender Equality Center Modeling attacks against device authentication using CMOS image sensor PUF
Hiroshi Yamada, Shunsuke Okura, Mitsuru Shiozaki, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) ICD2019-34 IE2019-40
A CMOS image sensor physically unclonable function (CIS-PUF) for device authentication by the unique responses extracted... [more] ICD2019-34 IE2019-40
pp.31-36
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
14:15
Ehime Ehime Prefecture Gender Equality Center Triple-Layered Ring Oscillators and Image Sensors Developed by Direct Bonding of SOI Wafers
Masahide Goto (NHK), Yuki Honda (NHK-ES), Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi (NHK), Takuya Saraya, Masaharu Kobayashi (Univ. of Tokyo), Eiji Higurashi (AIST), Hiroshi Toshiyoshi, Toshiro Hiramoto (Univ. of Tokyo) ICD2019-38 IE2019-44
We have studied on pixel-parallel three-dimensional (3D) integrated CMOS image sensors. We previously reported double-la... [more] ICD2019-38 IE2019-44
pp.45-49
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
14:40
Ehime Ehime Prefecture Gender Equality Center Highly sensitive and HDR image sensor using CTIA pixel circuit
Yotaro Imai, Toshinori Otaka, Yusuke Kameda, Takayuki Hamamoto (TUS) ICD2019-39 IE2019-45
We propose an image sensor that achieves both high sensitivity and high DR images by using a circuit structure that can ... [more] ICD2019-39 IE2019-45
pp.51-54
SDM 2019-10-24
15:40
Miyagi Niche, Tohoku Univ. Gas concentration distribution measurement in semiconductor process chamber using a high SNR CMOS absorption image sensor
Keigo Takahashi, Yhang Ricardo Sipauba Carvalho da Silva, Rihito Kuroda, Yasuyuki Fujihara, Maasa Murata, Hidekazu Ishii, Tatsuo Morimoto, Tomoyuki Suwa, Akinobu Teramoto, Shigetoshi Sugawa (Tohoku Univ.) SDM2019-66
This paper reports on gas concentration imaging using lateral overflow integration trench capacitor(LOFITreC) CMOS absor... [more] SDM2019-66
pp.65-68
HWS, VLD 2019-02-28
17:10
Okinawa Okinawa Ken Seinen Kaikan Error correction method for PUF utilizing the Pixel Variation in the CMOS Image Sensor
Ryota Ishiki, Masayoshi Shirahata (Ritsumeikan Univ.), Shunsuke Okura (Brillnics), Mitsuru Shiozaki, Takaya Kubota (Ritsumeikan Univ.), Kenichiro Ishikawa, Isao Takayanagi (Brillnics), Takeshi Fujino (Ritsumeikan Univ.) VLD2018-121 HWS2018-84
(To be available after the conference date) [more] VLD2018-121 HWS2018-84
pp.169-174
ICD, CPSY, CAS 2018-12-23
09:30
Okinawa   [Poster Presentation] Proposal of security system using CMOS Image Sensor PUF
Shiori Inoue, Ryota Issiki, Shohei Takano, Masayosi Shirahata (Ritsumeikan Univ.), Shunsuke Okura (Brillnics Inc.), Mitsuru Shiozaki, Takaya Kubota (Ritsumeikan Univ.), Kenichiro Ishikawa, Isao Takayanagi (Brillnics Inc.), Takeshi Fujino (Ritsumeikan Univ.) CAS2018-96 ICD2018-80 CPSY2018-62
(To be available after the conference date) [more] CAS2018-96 ICD2018-80 CPSY2018-62
pp.77-80
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-07
15:15
Hiroshima Satellite Campus Hiroshima Quarter Video Graphics Array Image Sensor with Linear and Wide-Dynamic-Range Output Developed by Pixel-Wise 3D Integration
Masahide Goto, Yuki Honda, Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi (NHK), Takuya Saraya, Masaharu Kobayashi, Eiji Higurashi, Hiroshi Toshiyoshi, Toshiro Hiramoto (Univ. of Tokyo) CPM2018-97 ICD2018-58 IE2018-76
We report on pixel-parallel three-dimensional (3D) integrated CMOS image sensors. Photodiodes (PDs), pulse generation ci... [more] CPM2018-97 ICD2018-58 IE2018-76
pp.43-48
SDM 2017-10-26
14:00
Miyagi Niche, Tohoku Univ. Analysis of Random Telegraph Noise Behaviors toward Changes of Source Follower Transistor Operation Conditions using High Accuracy Array Test Circuit
Shinya Ichino, Takezo Mawaki, Akinobu Teramoto, Rihito Kuroda, Shunichi Wakashima, Shigetoshi Sugawa (Tohoku Univ.) SDM2017-60
Behaviors of random telegraph noise (RTN) occurs at CMOS image sensors’ in-pixel source follower transistors (SF) toward... [more] SDM2017-60
pp.57-62
ICD, CPSY 2016-12-15
15:30
Tokyo Tokyo Institute of Technology [Poster Presentation] Quadrature-phase-detection TDC for single-slope ADCs
Sayuri Yokoyama, Sokuzin Na, Daisuke Uchida, Masayuki Ikebe, Tetsuya Asai, Masato Motomura (Hokkaido Univ.) ICD2016-81 CPSY2016-87
(To be available after the conference date) [more] ICD2016-81 CPSY2016-87
p.89
ICD, SDM, ITE-IST [detail] 2016-08-01
09:15
Osaka Central Electric Club [Invited Talk] Accelerating the Sensing World through Imaging Evolution
Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions) SDM2016-48 ICD2016-16
This presentation introduces the evolution of image sensors and the future prospect of sensing applications utilizing th... [more] SDM2016-48 ICD2016-16
p.1
SDM 2016-01-22
10:05
Tokyo Sanjo Conference Hall, The University of Tokyo [Invited Talk] Reliability Results of 4 million Micro Bump Interconnections of 3D Stacked 16 M Pixel Image Sensor
Yoshiaki Takemoto, Naohiro Takazawa, Mitsuhiro Tsukimura, Haruhisa Saito, Toru Kondo, Hideki Kato, Jun Aoki, Kenji Kobayashi, Shunsuke Suzuki, Yuichi Gomi, Seisuke Matsuda, Yoshitaka Tadaki (Olympus) SDM2015-108
We evaluated the reliability of 3D stacked CMOS image sensors (CISs) with 4 million micro bump inter-connections at a 7.... [more] SDM2015-108
pp.1-4
LQE, LSJ 2015-05-22
11:25
Ishikawa   High Sensitivity Image Sensor Overlaid with Thin-Film Crystalline Selenium/Gallium Oxide Heterojunction Photodiode
Shigeyuki Imura, Kenji Kikuchi, Kazunori Miyakawa, Hiroshi Ohtake, Misao Kubota (NHK), Tokio Nakada (TUS), Toru Okino, Yutaka Hirose, Yoshihisa Kato (Panasonic), Nobukazu Teranishi (University of Hyogo) LQE2015-13
We have developed an stacked image sensor using a thin-film crystalline selenium (c-Se) as a photoconversion layer. The ... [more] LQE2015-13
pp.63-67
ICD, CPSY 2014-12-02
11:10
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] The Evolution of CMOS Image Sensors
Yusuke Oike (Sony) ICD2014-103 CPSY2014-115
This presentation introduces the evolution of CISs and their applications utilizing image quality, 3D integration, and w... [more] ICD2014-103 CPSY2014-115
p.113
SDM 2014-01-29
15:55
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Three-dimensional Structures for High Saturation Signals and Crosstalk Suppression in 1.20 μm Pixel Back-Illuminated CMOS Image Sensor
Takekazu Shinohara, Kazufumi Watanabe (Sony Semiconductor), Kazunobu Ohta (Sony), Hajime Nakayama (Sony Semiconductor), Takafumi Morikawa (Sony), Keiichi Ohno, Dai Sugimoto (Sony Semiconductor), Shingo Kadomura, Teruo Hirayama (Sony) SDM2013-146
We propose two technologies, vertical transfer gate (VTG) and buried shielding metal (BSM), that can be applied to 1.20 ... [more] SDM2013-146
pp.47-50
ICD, ITE-IST 2012-07-27
15:20
Yamagata Yamagata University [Invited Talk] Recent Technical Trend in ISSCC -- Imagers and Biomedical Fields --
Jun Ohta (NAIST) ICD2012-29
This paper reviews the recent technical trend of ISSCC in the fields of Imagers and Biomedicals. [more] ICD2012-29
pp.81-84
ICD 2012-03-26
10:50
Osaka Osaka Univ. [Invited Talk] Brain neural activity measurement with implantable imaging devices
Jun Ohta, Takuma Kobayashi, Toshihiko Noda, Kiyotaka Sasagawa, Takashi Tokuda (NAIST) ICD2011-147
We demonstrate an implantable imaging device based on a CMOS image sensor technology to measure neural activities in a m... [more] ICD2011-147
pp.13-17
 Results 1 - 20 of 38  /  [Next]  
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