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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2014-10-17
16:20		 Kagoshima   Optimum Lifetime Prediction Testing under the Arrhenius Law
Naoki Tabuchi, Hideo Hirose (Kyutech) R2014-60		 In observing the actual lifetime of electric products, accelerated life tests are often used to save testing time and co... [more] R2014-60
pp.31-36
R 2013-10-18
14:20		 Fukuoka   A Mathematical Deterioration Model for the Thermal Stress
Hideo Hirose, Takenori Sakumura (Kyushu Inst. of Tech.) R2013-66		 We try to construct mathematical models to represent the relationship between the thermal stress and the deterioration r... [more] R2013-66
pp.13-18
EMD 2009-11-20
14:50		 Tokyo Nippon Institute of Technology, Kanda Campus, Tokyo, Japan Growth of oxide film on tin plated surface of connector contacts and it effect on contact resistance
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech), Terutaka Tamai (Mie Univ.) EMD2009-100		 Tin plating has been applied widely to electrical connector contacts to save the cost. However, the tin plated surfaces ... [more] EMD2009-100
pp.133-136
EE 2006-02-16
16:50		 Kumamoto   Lifetime and Residual Capacity Estimate of the Stationary Lithium-ion Secondary Cells with Large Capacity
Toshio Matsushima (NTT-F), Toshio Horie (NTT) 		Lifetimes of large–capacity lithium-ion secondary cells were estimated by high-temperature-acceleration tests unde... [more] EE2005-68
pp.45-50
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