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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2012-04-20 13:25 |
Ishikawa |
Kanazawa Univ. |
Proposal of a new technique and probe for the current measurement of each pin in a BGA package Takeshi Nakayama, Daisaku Kitagawa, Masahiro Ishii, Yoshiyuki Saito (Panasonic) EMCJ2012-3 |
To maintain operational stability of LSI, power supply and ground pin count has increased. This is one of the factors of... [more] |
EMCJ2012-3 pp.13-18 |
EMCJ |
2012-04-20 13:50 |
Ishikawa |
Kanazawa Univ. |
Placement optimization of the ground pins based on the measurement results of the currents flowing through each ground pin Takeshi Nakayama, Daisaku Kitagawa, Masahiro Ishii, Yoshiyuki Saito (Panasonic) EMCJ2012-4 |
To maintain operational stability of LSI, power supply and ground pin count has increased. This is one of the factors of... [more] |
EMCJ2012-4 pp.19-24 |
EMCJ, EMD |
2010-07-16 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
ESD waveform measurement with current probe and optical voltage probe Mikiya Iida (Toshiba Corp.) EMCJ2010-36 EMD2010-21 |
ESD causes the malfunction of an electronic equipment. In order to clarify the ESD influence to malfunction mechanism, i... [more] |
EMCJ2010-36 EMD2010-21 pp.25-30 |
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