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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2024-02-21 13:30 |
Tokyo | Tokyo University-Hongo-Engineering Bldg.4 (Primary: On-site, Secondary: Online) |
[Invited Talk]
Direct observation of local electromagnetic field distribution in materials and devices Naoya Shibata (UTokyo)  SDM2023-84 |
(To be available after the conference date) [more] | SDM2023-84 pp.16-19 |
| SDM | 2023-06-26 13:30 |
Hiroshima | Hiroshima Univ. (Res. Inst. of Nanodevices) | [Invited Lecture]
Pioneering Nondestructive Imaging of Ferroelectric Capacitors by Operando Laser-Based Photoemission Electron Microscopy Hirokazu Fujiwara, Yuki Itoya, Masaharu Kobayashi, Cedric Bareille, Shik Shin, Toshiyuki Taniuchi (Univ. of Tokyo) SDM2023-32 |
In order to elucidate the mechanism of characteristic modulations in HfO$_2$-based ferroelectric capacitors, an in-situ ... [more] | SDM2023-32 pp.19-22 |
| ED | 2022-12-09 13:45 |
Aichi | 12/8 Nagoya University, 12/9 WINC AICHI | [Invited Talk]
Development of microscopic nanomechanical measurement method using length extension quarz resonator
-- Measurement of interatomic bond strength -- Yoshifumi Oshima, Jiaqi Zhang (JAIST), Toyoko Arai (Kanazawa Univ.), Masahiko Tomitori (JAIST) ED2022-65 |
A "microscopic nanomechanical measurement method" was developed by combining a transmission electron microscope (TEM) sa... [more] | ED2022-65 pp.47-50 |
| IE, ITS, ITE-AIT, ITE-ME, ITE-MMS [detail] | 2022-02-21 15:20 |
Online | Online | A Note on Electron Microscope Image Generation from Mix Proportion and Material Property via Generative Adversarial Network for Rubber Materials Rintaro Yanagi, Ren Togo, Keisuke Maeda, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
Estimating the properties of rubber materials from ingredients is necessary to accelerate rubber material development. A... [more] | |
| ED | 2021-12-09 15:35 |
Online | Online | Optimal design of planar type electron gun using graphene gate electrode for microscope Yukino Kameda (Shizuoka Univ. /AIST), Katsuhisa Murakami, Masayoshi Nagao (AIST), Hidenori Mimura, Yoichiro Neo (Shizuoka Univ.) ED2021-47 |
A planar type electron gun using graphene gate electrode can be operated in a low vacuum condition and a low applied vol... [more] | ED2021-47 pp.47-50 |
| IE, ITS, ITE-MMS, ITE-ME, ITE-AIT [detail] | 2021-02-19 14:15 |
Online | Online | [Special Talk]
A Note on Electron Microscope Image Generation from Mix Proportion via Conditional Style Generative Adversarial Network for Rubber Materials Rintaro Yanagi, Ren Togo, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
Estimating the properties of rubber materials from ingredients is necessary to accelerate rubber material development. I... [more] | |
| MRIS, ITE-MMS | 2020-10-05 14:45 |
Online | Online | Evaluation of perpendicular magnetic anisotropy in Co2FeSi/MgO bilayers Eisuke Matsushita, Yota Takamura, Yoshiya Stutler, Shigeki Nakagawa (Tokyo Tech) MRIS2020-4 |
We investigated the origin of perpendicular magnetic anisotropy in full-Heusler alloy Co_2FeSi(CFS)/MgO bilayers in whic... [more] | MRIS2020-4 pp.16-19 |
| PRMU, IPSJ-CVIM | 2020-03-16 15:10 |
Kyoto | (Cancelled but technical report was issued) |
Metal Material Analysis using SEM Images of Multiple Magnifications Ryunosuke Ito, Keisuke Kameyama (Univ. Tsukuba), Hideitsu Hino (ISM) PRMU2019-78 |
In recent years, in order to quickly develop metal materials having special properties, it is urgently necessary to make... [more] | PRMU2019-78 pp.71-76 |
| ITE-HI, IE, ITS, ITE-MMS, ITE-ME, ITE-AIT [detail] | 2020-02-27 16:20 |
Hokkaido | Hokkaido Univ. (Cancelled but technical report was issued) |
A Note on Generation of Electron Microscope Images via Auxiliary Classifier Generative Adversarial Network with Mix Proportions Misaki Kanai, Ren Togo, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
In this paper, we investigate a method for generation of images that represent the internal structure of rubber material... [more] | |
| ITS, IE, ITE-MMS, ITE-HI, ITE-ME, ITE-AIT [detail] | 2019-02-20 09:15 |
Hokkaido | Hokkaido Univ. | A Note on Estimation of Characteristic Curve for Rubber Materials Using Electron Microscope Images and Mix Proportions Naoki Saito, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
This paper presents an estimation method of characteristic curves for rubber materials using electron microscope images ... [more] | |
| ED, LQE, CPM | 2018-11-30 09:50 |
Aichi | Nagoya Inst. tech. | Chemical Bath Deposition of Undoped and Li Doped CuO Films and Thier Structural and Electrical Properties Hideyuki Okada, Tomoaki Terasako, Kenji Gochoh, Naoya Hayashimoto (Ehime Univ.) ED2018-43 CPM2018-77 LQE2018-97 |
Undoped and Li-doped CuO films were grown on Au seed layers by chemical bath deposition (CBD) using the mixed aqueous so... [more] | ED2018-43 CPM2018-77 LQE2018-97 pp.49-54 |
| IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] | 2017-02-20 13:00 |
Hokkaido | Hokkaido Univ. | A Note on Property Estimation Using Electron Microscope Images and Mix Proportions of Rubbers Naoki Saito, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
In this paper, we propose a property estimation method using electron microscope images and mix proportions of rubber ma... [more] | |
| PRMU | 2016-10-21 11:10 |
Miyazaki | Photometric Stereo by SEM Image Utilizing Region Division Hiroki Matsuse, Gou Koutaki, Keiichi Uchimura (Kumamoto Univ.), Atsushi Miyamoto (Hitachi) PRMU2016-100 |
In this paper, we present a three-dimensional (3D) reconstruction method for semiconductor pattern using a scanning elec... [more] | PRMU2016-100 pp.55-60 |
|
| CPM | 2016-07-23 10:25 |
Ehime | Growth and Shape Controllability of SnO2 Nanowires by Alternate Source Supply Tomoaki Terasako (Ehime Univ.), Masakazu Yagi (Natl. Inst. Technol, Kagawa Coll.) CPM2016-29 |
V apor-liquid-solid (VLS) growth of tin dioxide (SnO2) nanowires (NWs) on the c-plane sapphire substrate co... [more] | CPM2016-29 pp.21-26 |
|
| EMD, R | 2016-02-19 13:20 |
Shizuoka | Azarea,Shizuoka | Investigation of Electrical Contacts on a Nanometer Scale using a Nano-manipulator in Scanning Electron Microscope Jun Toyoizumi, Masanori Onuma, Takaya Kondo, Kikuo Mori (yazaki), Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe (AIST) R2015-65 EMD2015-93 |
The indentation using tin oxide film which was deposited on tin substrate was executed by a tungsten probe whose curvatu... [more] | R2015-65 EMD2015-93 pp.1-6 |
| MRIS, ITE-MMS | 2015-10-23 11:10 |
Osaka | Osaka Univ. | [Invited Talk]
Analysis of magnetic devices by spin-polarized scanning electron microscopy
-- Microscopic Magnetization Measurements using Spin Polarization of Electrons -- Teruo Kohashi (Hitachi) MR2015-21 |
Spin-Polarized Scanning Electron Microscopy (Spin SEM) is one way for observing magnetic domain structures taking advant... [more] | MR2015-21 pp.37-41 |
| IE, ITS, ITE-AIT, ITE-HI, ITE-ME, ITE-MMS, ITE-CE [detail] | 2015-02-23 15:00 |
Hokkaido | Hokkaido Univ. | A Note on Image Retrieval Based on Evaluation of Retrieval Results
-- An Application to Similarity Evaluation of Surface Structure of Organisms Taken by Scanning Electron Microscope -- Akihiro Takahashi, Takahiro Ogawa, Miki Haseyama (Hokkaido Univ.) |
This paper presents image retrieval based on evaluation of retrieval results by scanning electron microphotographs (SEM ... [more] | |
| CPM | 2012-10-26 17:05 |
Niigata | Interface between GaP and Si substrates prepared using metalorganic vapor phase epitaxy Tatsuya Takagi, Ryo Miyahara, Yasushi Takano (Shizuoka Univ.) CPM2012-101 |
GaP layers were grown on Si substrates 2° or 4°-misoriented toward (011) using metalorganic vapor phase epitaxy. The sub... [more] | CPM2012-101 pp.45-48 |
|
| MRIS, ITE-MMS | 2012-10-19 10:50 |
Akita | AIT | [Invited Talk]
Interface magnetism of iron meteorite studied by synchrotron radiation and its applied research Masato Kotsugi (SPring-8/JASRI), Chiharu Mitsumata (NIMS) MR2012-28 |
Photoelectron emission microscopy (PEEM) is applied on iron meteorite to understand the magnetic and metallographic prop... [more] | MR2012-28 pp.59-63 |
| CPM | 2012-08-08 14:15 |
Yamagata | Influence of Si surface annealing on GaP on Si substrates using metalorganic vapor phase epitaxy Tatsuya Takagi, Ryo Miyahara, Yohsuke Horie, Yasushi Takano (Shizuoka Univ.) CPM2012-36 |
GaP layers were grown on Si substrates using metalorganic vapor phase epitaxy. In order to suppress APD generation, Si(1... [more] | CPM2012-36 pp.17-20 |
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