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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 20  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
OME, IEE-DEI 2023-01-18
14:45
Aichi Aichi Himaka island ホテル浦島 [Invited Talk] Research trend of Tin based perovskite solar cell -- From Lead free perovskite solar cell to all perovskite tandem solar cells --
Shuzi Hayase (UEC) OME2022-64
The certified efficiency of the lead halide perovskite solar cell (Pb-PVK PV) is now 25.7 %, which is close to that of s... [more] OME2022-64
pp.4-7
OME, IEE-DEI 2021-03-01
13:30
Online Online [Invited Talk] Trend for Research and Development on Pb-free Sn-perovskite solar cells
Shuzi Hayase (UEC) OME2020-19
Certified efficiency of the solar cells consisting of conventional Pb perovskite as the light harvesting layer reached 2... [more] OME2020-19
pp.1-3
EMD 2020-03-06
14:30
Chiba CHIBA Institute of Technology Tsudanuma Campus
(Cancelled but technical report was issued)
Whisker formation and growth mechanism in tin plating
Inoue Shintaro, Iida Kazuo (Mie Univ.) EMD2019-64
Reliability of connection is required for connectors, and tin is widely used for surface treatment. However, in the plat... [more] EMD2019-64
pp.25-30
EMD 2017-03-03
14:45
Chiba   Observation of whisker growth in various tin plating
Yuki Wada, Kazuo Iida (Mie Univ.), Takafumi Akashi (ASAHI PLATING) EMD2016-105
Reliability of connection is required for connectors, and tin is widely used for surface treatment. However, in the plat... [more] EMD2016-105
pp.25-28
EMD 2015-05-15
14:25
Akita Akita University Tegata Campus Fretting Characteristics about Contact Load of Tin-plated Contacts
Atsushi Shimizu, Yasushi Saitoh (AutoNetwork Tech.) EMD2015-3
The contact resistance between tin-plated contacts increases with rubbing under low contact load due to accumulated oxid... [more] EMD2015-3
pp.13-18
R 2013-11-14
14:50
Osaka   Effect of Plate-Shape Ni-Sn IMC on the Growth Mechanism of Tin Whisker under Thermal Shock Stress
Akira Saito, Akira Okamoto, Yoshihiro Iwahori, Makoto Ogawa (Mutrata MFG), Akihiro Motoki (Sabae Mutrata MFG) R2013-76
With the promotion of lead-free solder in these years, some segments have expressed concern about the possibility of tin... [more] R2013-76
pp.11-16
R 2013-11-14
15:15
Osaka   A Study on Sn-whisker growth by thermal cycle
Sadanori Itou (Itoken office) R2013-77
Sn whisker grow up like curl shape under the thermal cycle test. However in some conditions, it grow up straight shape. ... [more] R2013-77
pp.17-20
EMD, R 2012-02-17
14:05
Kyoto   A Study for lath-like Compound growth factor in Sn-Ni metalic plate(2)
Sadanori Ito (itoken), Masafumi Suzuki (omron), Tomio Taniguchi (UP) R2011-48 EMD2011-122
Lath-like Ni-Sn intermetallics grow in Sn plate layer on Ni plate and cause worse solderability.
The compound appear in... [more]
R2011-48 EMD2011-122
pp.37-40
EMD, R 2012-02-17
15:05
Kyoto   Effect of Intermittent Time on Fretting Corrosion of Tin Plated Coupon
Jumpei Yasuda, Kazuo Iida (Mie Univ.), Yasushi Saitoh (ANTech), Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech) R2011-50 EMD2011-124
Recently, there is a problem as increasing contact resistance by fretting corrosion in automobile connector. This increa... [more] R2011-50 EMD2011-124
pp.45-50
EMD, R 2011-02-18
13:05
Shizuoka Shizuoka Univ. (Hamamatsu) Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication
Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.) R2010-42 EMD2010-143
For tin plated connector contacts, it was found that friction coefficient at lubricated contacts was higher than the fri... [more] R2010-42 EMD2010-143
pp.1-6
EMD 2011-01-28
13:50
Tokyo Japan Aviation Electronics Industry,Limited Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts
Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) EMD2010-137
It is observed that contact resistance for tin plated contact in automotive connectors increased due to fretting corrosi... [more] EMD2010-137
pp.11-16
EMD 2011-01-28
14:15
Tokyo Japan Aviation Electronics Industry,Limited Fretting characteristics about the shape and weight of tin-plated contacts
Tomishige Tai, Tetsuya Komoto (JAE) EMD2010-138
This paper, to describe the increase in contact resistance due fretting corrosion on tin-plated layer of the contact geo... [more] EMD2010-138
pp.17-21
EMD 2010-03-05
13:00
Kanagawa Yokohama National University Relation between Oxidation Thickness and Contact Resistance on Fretting Corrosion of the Tin Plated Contacts
Soshi Masui, Shigeru Sawada, Terutaka Tamai, Kazuo Iida (Mie Univ.) EMD2009-127
(To be available after the conference date) [more] EMD2009-127
pp.1-4
EMD 2010-03-05
16:05
Kanagawa Yokohama National University Influence of Paraffin on Contact Resistance of Sn and Au Contacts
Keisuke Taniguchi, Masaru Takeshita, Kazuo Iida, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2009-138
The decrease of force for insertion of the automotive connector is attempted along with advancement of the miniaturizati... [more] EMD2009-138
pp.45-48
EMD, R 2010-02-19
15:20
Osaka   Observation of wear status of tin plating for automotive connector at initial stage of sliding
Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) R2009-56 EMD2009-123
Tin plated contacts are widely used for common electrical contact due to the inexpensive and reliability. On the other h... [more] R2009-56 EMD2009-123
pp.37-42
EMD, R 2010-02-19
15:45
Osaka   Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance
Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124
Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere... [more] R2009-57 EMD2009-124
pp.43-48
EMD 2009-03-06
16:35
Tokyo Kougakuin Univ. Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic -- Ellipsometric Study --
Yuya Nabeta, Terutaka Tamai, Yasushi Saitoh, Shigeru Sawada, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AN Technorogies) EMD2008-146
Tin plated contacts has been applied widely to electrical contacts of electromechanical devices as well as gold plated c... [more] EMD2008-146
pp.49-52
OME 2009-01-21
14:50
Aichi Nagoya Univ. Development of a novel silicone compound with high thermal endurance
Hiroaki Cho, Fumito Sano, Shuhei Nakamura (Mie Univ.), Kazuyo Miyata (Japan Scie and Tech Agence Plaza Tokai), Wataru Shimizu, Yasushi Murakami (Shinshu Univ.) OME2008-90
Poly(dimethylsiloxane) (PDMS) is a base polymer of silicone compound which used, for example, as sealants, adhesives or ... [more] OME2008-90
pp.43-48
EMD 2008-04-18
14:00
Tokyo NTT Musashino Research and Development Center Singularity of Contact Resistance Chracteristics for Tin Contacts
Terutaka Tamai, Katsunori Hotta, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech.) EMD2008-2
Abstract Plated Sn group is applied widely to connector contacts. Since surfaces of the Sn covered with its oxide films... [more] EMD2008-2
pp.7-12
EMD 2006-10-20
14:25
Kanagawa   Study of Tin Whisker Generated by External Force
Daisuke Machihara, Kazuomi Satou (JAE)
Along with spread of lead free plating, problem of whiskers in tin plating becomes an important issue. Especially in con... [more] EMD2006-50
pp.5-8
 Results 1 - 20 of 20  /   
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