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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPM 2005-01-28
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. Learning-Based Improvement in Fault Tolerance of Hopfield Associative Memories
Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui (Univ. of Hyogo)
Hopfield neural networks tolerating weight faults are presented. The weight restriction and fault injection are adopted... [more] CPM2004-172 ICD2004-217
pp.59-64
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