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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, HWS, ICD | 2024-03-01 14:50 |
Okinawa | (Primary: On-site, Secondary: Online) |
Defect Coverage Estimation by Sampling in Testing Power TSV Koutaro Hachiya, Yudai Kawakami (THU)  VLD2023-129 HWS2023-89 ICD2023-118 |
As a test for power TSVs (Through Silicon Via) in 3D-IC, a method has been proposed to detect open defects by placing po... [more] | VLD2023-129 HWS2023-89 ICD2023-118 pp.157-160 |
| DC | 2023-12-08 13:30 |
Nagasaki | ARKAS SASEBO (Primary: On-site, Secondary: Online) |
DC2023-87 |
(To be available after the conference date) [more] | DC2023-87 pp.1-6 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-16 17:10 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Takumi Sugioka, Yosikazu Nagamura (Tokyo Metoropolitan Univ.), Masayuki Arai (Nihon Univ.), Satoshi Fukumoto (Tokyo Metoropolitan Univ.) VLD2023-62 ICD2023-70 DC2023-69 RECONF2023-65 |
(To be available after the conference date) [more] | VLD2023-62 ICD2023-70 DC2023-69 RECONF2023-65 pp.168-172 |
| SDM | 2023-10-13 13:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Defect Reduction in UV Nanoimprint Lithography Toshiki ITO (Canon) SDM2023-54 |
Field-by-field type UV nanoimprint lithography equipped with on-demand inkjet dispense system has been developed, which ... [more] | SDM2023-54 pp.1-6 |
| SS, DC | 2023-10-12 11:30 |
Nagano | (Primary: On-site, Secondary: Online) |
SS2023-30 DC2023-36 |
(To be available after the conference date) [more] | SS2023-30 DC2023-36 pp.50-55 |
| CPM | 2023-08-01 10:40 |
Hokkaido | (Primary: On-site, Secondary: Online) |
Review of Characterization of Metal/GaN Schottky Contacts Kenji Shiojima (Univ. of Fukui) CPM2023-21 |
This paper reviews innovation of metal/GaN contacts from the aspects of crystal quality, process technique, and basic un... [more] | CPM2023-21 pp.36-39 |
| ICTSSL, CAS | 2023-01-27 16:00 |
Tokyo | TBD (Primary: On-site, Secondary: Online) |
Ultrawideband Absorptive Common-mode Microstrip Line Filter Based on Resistive Defected Ground Structure Akihiro Narushima, Koji Wada, Fengchao Xiao (UEC) CAS2022-92 ICTSSL2022-56 |
In this study, we propose a bidirectional absorptive common-mode filter(A-CMF) with ultrawideband characteristics by usi... [more] | CAS2022-92 ICTSSL2022-56 pp.145-150 |
| OME, IEE-DEI | 2023-01-18 14:45 |
Aichi | Aichi Himaka island ホテル浦島 | [Invited Talk]
Research trend of Tin based perovskite solar cell
-- From Lead free perovskite solar cell to all perovskite tandem solar cells -- Shuzi Hayase (UEC) OME2022-64 |
The certified efficiency of the lead halide perovskite solar cell (Pb-PVK PV) is now 25.7 %, which is close to that of s... [more] | OME2022-64 pp.4-7 |
| MSS, SS | 2023-01-11 13:55 |
Osaka | (Primary: On-site, Secondary: Online) |
MSS2022-57 SS2022-42 |
(To be available after the conference date) [more] | MSS2022-57 SS2022-42 pp.72-77 |
| EMCJ, MW, EST, IEE-EMC [detail] | 2022-10-14 10:50 |
Akita | Akita University (Primary: On-site, Secondary: Online) |
A Study on Planar Metallic Photonic Crystal Resonators Jiaxing FAN, Chunping Chen, Liangchao JIang, Ming Wang, Takaharu Hiraoka, Tetsuo Anada (Kanagawa Univ) EMCJ2022-55 MW2022-101 EST2022-65 |
In recent years, the application of planar metallic photonic crystal (MPhC) structures have been attracting a lot of att... [more] | EMCJ2022-55 MW2022-101 EST2022-65 pp.102-107 |
| EMD, R, LQE, OPE, CPM | 2022-08-25 13:35 |
Chiba | (Primary: On-site, Secondary: Online) |
[Invited Talk]
Development of wafer quality evaluation platform for realization of high-reliable SiC power semiconductor devices Junji Senzaki (AIST) R2022-17 EMD2022-5 CPM2022-22 OPE2022-48 LQE2022-11 |
Various power supplies and inverters equipped with SiC power semiconductor devices that realize energy saving and miniat... [more] | R2022-17 EMD2022-5 CPM2022-22 OPE2022-48 LQE2022-11 pp.7-12 |
| QIT (2nd) |
2022-05-30 13:30 |
Online | Online | [Poster Presentation]
Creation of single silicon-vacancy centers in nanodiamonds by ion implantation Kazuki Suzuki, Konosuke Shimazaki, Hideaki Takashima (Kyoto Univ.), Hiroshi Abe, Ohshima Takeshi (QST), Shigeki Takeuchi (Kyoto Univ.) |
Color centers in nanodiamonds are expected to have applications in quantum technology. Among them, silicon vacancy cente... [more] | |
| SS, MSS | 2022-01-11 15:10 |
Nagasaki | Nagasakiken-Kensetsu-Sogo-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Improving the accuracy of SBFL by weighting test cases using the proximity of execution routes. Haruka Yoshioka, Yoshiki Higo, Shinji Kusumoto (Osaka Univ) MSS2021-39 SS2021-26 |
(To be available after the conference date) [more] | MSS2021-39 SS2021-26 pp.46-51 |
| SDM | 2021-11-11 15:15 |
Online | Online | [Invited Talk]
Characterization techniques of plasma process-induced defect creation in electronic devices Koji Eriguchi (Kyoto Univ.) SDM2021-57 |
Plasma processing plays an important role in manufacturing leading-edge electronic devices. Plasma etching achieves fine... [more] | SDM2021-57 pp.23-28 |
| KBSE, SWIM | 2021-05-22 10:30 |
Online | Online | Feature Selection for Avoiding Overfitting of Software Defect Prediction Yuta Nagai, Ryuichi Takahashi (Ibaraki Univ.) KBSE2021-7 SWIM2021-7 |
Software defect prediction by machine learning is important for software development, and there is much research on how ... [more] | KBSE2021-7 SWIM2021-7 pp.37-43 |
| OME, IEE-DEI | 2021-03-01 13:30 |
Online | Online | [Invited Talk]
Trend for Research and Development on Pb-free Sn-perovskite solar cells Shuzi Hayase (UEC) OME2020-19 |
Certified efficiency of the solar cells consisting of conventional Pb perovskite as the light harvesting layer reached 2... [more] | OME2020-19 pp.1-3 |
| US | 2021-02-22 15:45 |
Online | Online | Study on normalized spectral entropy in defect detection of noncontact acoustic inspection Kazuko Sugimoto, Tsuneyoshi Sugimoto (Toin Univ. of Yokohama) US2020-72 |
Noncontact acoustic inspection method is a non-contact non-destructive manner for remotely detecting and visualizing int... [more] | US2020-72 pp.29-34 |
| SDM | 2021-01-28 15:35 |
Online | Online | [Invited Talk]
Evaluation of Defects in Si Substrates Introduced by Stochastic Lateral Straggling during Plasma Exposure and Its Impact on Ultra-low Leakage Devices Yoshihiro Sato, Takayoshi Yamada, Kazuko Nishimura, Masayuki Yamasaki, Masashi Murakami (Panasonic), Keiichiro Urabe, Koji Eriguchi (Kyoto Univ.) SDM2020-53 |
In the design of ultra-low leakage devices such as image sensors, it is critical to understand the distribution of an ex... [more] | SDM2020-53 pp.17-20 |
| QIT (2nd) |
2020-12-11 11:40 |
Online | Online | Localization of quantum walks on a line Chusei Kiumi (Yokohama National Univ.), Kei Saito (Kanagawa Univ.) |
Quantum walks, the quantum mechanical counterpart of classical random walks, has been actively studied since the 2000s, ... [more] | |
| US | 2020-02-28 12:45 |
Tokyo | Defect detection using resonance frequency identification by spatial spectral entropy for noncontact acoustic inspection
-- Experimental result and analysis of a concrete slab of viaduct from a distance of 30m -- Kazuko Sugimoto, Tsuneyoshi Sugimoto (Toin Univ. of Yokohama), Noriyuki Utagawa, Chitose Kuroda (SatoKogyo) US2019-99 |
In noncontact acoustic inspection method, internal defects of composite materials, especially concrete was detected and ... [more] | US2019-99 pp.1-5 |
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