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Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE, LSJ 2015-05-22
11:25		 Ishikawa   High Sensitivity Image Sensor Overlaid with Thin-Film Crystalline Selenium/Gallium Oxide Heterojunction Photodiode
Shigeyuki Imura, Kenji Kikuchi, Kazunori Miyakawa, Hiroshi Ohtake, Misao Kubota (NHK), Tokio Nakada (TUS), Toru Okino, Yutaka Hirose, Yoshihisa Kato (Panasonic), Nobukazu Teranishi (University of Hyogo) LQE2015-13		 We have developed an stacked image sensor using a thin-film crystalline selenium (c-Se) as a photoconversion layer. The ... [more] LQE2015-13
pp.63-67
OPE, LQE, CPM, EMD, R 2013-08-29
10:45		 Hokkaido sun-refre Hakodate Mid-infrared sensors with type-II InAs/GaSb superlattice absorption layers grown on InP substrates
Kohei Miura, Yasuhiro Iguchi (Sumitomo Electric), Yuuichi Kawamura (Osaka Prefecture Univ.) R2013-32 EMD2013-38 CPM2013-57 OPE2013-61 LQE2013-31		 Type-II InAs/GaSb superlattices (SLs), which are attractive for absorption layers of mid-infrared sensors, are usually g... [more] R2013-32 EMD2013-38 CPM2013-57 OPE2013-61 LQE2013-31
pp.19-24
OME 2013-03-05
10:35		 Saga AIST Kyushu Center Effects of dark currents on the performance of photorefractive polymers
Takashi Sassa, Takashi Fujihara (RIKEN) OME2012-92		 The influence of a transient dark current on the buildup dynamics of photorefractive index gratings, which are photo-exc... [more] OME2012-92
pp.9-12
CPM, SDM, ED 2011-05-20
13:00		 Aichi Nagoya Univ. (VBL) Development of radiation imaging arrays using thick CdTe layers grown on Si substrates by MOVPE
Tadahiro Tachi, Hiroaki Inuzuka, Naoya Fujimura, Takaki Kondo, Syuhei Nanba, Shinya Muramatsu, Yasunori Agata, Madan Niraula, Kazuhito Yasuda (NTT) ED2011-26 CPM2011-33 SDM2011-39		 We have been developing large area and high performance 2-dimensional (2D) radiation imaging arrays using thick CdTe lay... [more] ED2011-26 CPM2011-33 SDM2011-39
pp.131-134
ICD 2009-12-14
10:00		 Shizuoka Shizuoka University (Hamamatsu) [Invited Talk] Image Sensor -- An absorbing device with the hardest design --
Satoshi Aoyama, Park Jong-Ho, Takashi Watanabe (Brookman Tech.), Shoji Kawahito (Brookman Tech./Shizuoka Univ.) ICD2009-76		 Many kinds of image sensors are used in various fields as for the key device of the image input, as well as other inform... [more] ICD2009-76
pp.1-5
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