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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED, CPM, SDM |
2015-05-28 15:15 |
Aichi |
Venture Business Laboratory, Toyohashi University of Technology |
Control of N composition of GaAsN alloy grown by surface nitridation Noriyuki Urakami, Keisuke Yamane, Hiroto Sekiguchi, Hiroshi Okada, Akihiro Wakahara (Toyohashi Tech.) ED2015-20 CPM2015-5 SDM2015-22 |
We researched growth conditions effect for N composition and luminescence property on dilute nitride GaAsN alloy grown b... [more] |
ED2015-20 CPM2015-5 SDM2015-22 pp.21-26 |
CPM |
2013-08-01 14:10 |
Hokkaido |
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Growth of (In)GaAsN thin films for Ultra High Efficiency Multi-Junction Solar Cells by Atomic Layer Epitaxy Hidetoshi Suzuki, Tomohiro Haraguchi, Toshihiro Yamauchi, Atsuhiko Fukuyama, Tetsuo Ikari (Univ. of Miyazaki) CPM2013-41 |
High quality GaAsN thin films were fabricated by atomic layer epitaxy (ALE). The effects of gas flow sequences
on self-... [more] |
CPM2013-41 pp.11-15 |
SDM, ED, CPM |
2013-05-16 15:45 |
Shizuoka |
Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. |
Formation of GaAsN alloys by surface nitridation Noriyuki Urakami, Akihiro Wakahara, Hiroto Sekiguchi, Hiroshi Okada (Toyohashi Univ. of Tech.) ED2013-20 CPM2013-5 SDM2013-27 |
GaAsN alloys was grown by surface nitridation and applied for the growth of quantum well (QW). Increase of incorporation... [more] |
ED2013-20 CPM2013-5 SDM2013-27 pp.23-26 |
ED, CPM, SDM |
2006-05-19 10:15 |
Aichi |
VBL, Toyohashi University of Technology |
InGaPN/GaPN Quantum Well Structures for Si/III-V-N Optoelectronic Integrated Circuits Kazuyuki Umeno, Sung Man Kim, Yuzo Furukawa, Hiroo Yonezu, Akihiro Wakahara (Toyohashi Univ. Tech.) |
Direct-transition InGaPN/GaPN quantum well (QW) structures were grown on GaP substrates by RF-MBE at 500ºC for appl... [more] |
ED2006-32 CPM2006-19 SDM2006-32 pp.67-72 |
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