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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
KBSE |
2022-03-10 12:45 |
Online |
Online (Zoom) |
A Proposed Method for Detecting Presentation Failures Using Screenshots and DOM Analysis Takato Okajima (NIT), Takafumi Tanaka (Tamagawa Univ.), Atsuo Hazeyama (Gakugei Univ.), Hiroaki Hashiura (NIT) KBSE2021-54 |
In the mobile and web application, GUI visual is as specified be of importance. Because of that, many proposed of GUI vi... [more] |
KBSE2021-54 pp.78-83 |
SS |
2019-03-05 13:10 |
Okinawa |
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Attempt of ScreenTransition Test with Appropriate Granularity in Test Script Automatic Generation Toshiyuki Kurabayashi, Hiroyuki Kirinuki, Yu Yoshimura, Yu Adachi, Haruto Tanno (NTT) SS2018-75 |
(To be available after the conference date) [more] |
SS2018-75 pp.139-144 |
SS |
2019-03-05 13:35 |
Okinawa |
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Stepwise detection of image differences using screen elements in UI Layout Testing Yu Yoshimura, Yu Adachi, Haruto Tanno (NTT) SS2018-76 |
Methods for efficiently performing regression testing of software development have been proposed.
It is a method of ima... [more] |
SS2018-76 pp.145-150 |
KBSE |
2013-03-15 12:00 |
Tokyo |
Shibaura Institute of Technology |
A Software Regression Testing Tool with the Facilities to Restore the State at Program Execution of a Program under Test. Yuhei Otani (Shibaura Inst. of Tech.), Hiroaki Hashiura (Toyo Univ.), Seiichi Komiya (Shibaura Inst. of Tech.) KBSE2012-83 |
In today's software development is often to change or maintain the existing system. Therefore, regression testing is bec... [more] |
KBSE2012-83 pp.85-90 |
SS |
2008-08-01 10:00 |
Hokkaido |
Future University-Hakodate |
A Code Review Technique to Reduce Regression Test Cases for Omitted Fault Koichi Tamura, Yasutaka Kamei, Hidetake Uwano, Shuuji Morisaki, Tomoko Matsumura, Ken-ichi Matsumoto (NAIST) SS2008-23 |
Some faults need many re-testing for fixing faults in test phase. These faults increase cost and delay of release, and m... [more] |
SS2008-23 pp.61-66 |
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