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Committee Date Time Place Paper Title / Authors Abstract Paper #
SCE 2018-01-31
11:20		 Tokyo Kikai-Shinko-Kaikan Bldg. Fundamental investigation on characteristic change of YBCO thin films by focused ion beam processing
Yuji Miyato (Osaka Univ.) SCE2017-35		 Recently, the focused ion beam processing of YBCO thin films, leading to the local change of the superconducting charact... [more] SCE2017-35
pp.21-26
EMD, R 2016-02-19
13:20		 Shizuoka Azarea,Shizuoka Investigation of Electrical Contacts on a Nanometer Scale using a Nano-manipulator in Scanning Electron Microscope
Jun Toyoizumi, Masanori Onuma, Takaya Kondo, Kikuo Mori (yazaki), Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe (AIST) R2015-65 EMD2015-93		 The indentation using tin oxide film which was deposited on tin substrate was executed by a tungsten probe whose curvatu... [more] R2015-65 EMD2015-93
pp.1-6
SDM, ED, CPM 2013-05-16
16:35		 Shizuoka Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. Focused ion beam Ga implantation into P-doped SOI layer and its Seebeck coefficient
Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./ Research Fellow of JSPS), Masaru Shimomura, Akihiro Ishida, Hiroya Ikeda (Shizuoka Univ.) ED2013-22 CPM2013-7 SDM2013-29		 With the aim of fabricating a thermopile infrared detector using Si nanowires, we have investigated the formation of a p... [more] ED2013-22 CPM2013-7 SDM2013-29
pp.33-37
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