IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 16 of 16  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
OME 2019-12-20
13:00
Saga avancée (Saga city) Carbon-bridged Oligo(phenylenevinylene)s (COPV6) Single-Electron Transistor based on Electroless Au-plated (ELGP) Nanogap Electrodes
Rikiya Irie, Chun Ouyang, Yuma Ito, Phan Trong Tue (Tokyo Tech), Hayato Tsuji (Kanagawa Unib), Eiichi Nakamura (Univ. Tokyo), Yutaka Majima (Tokyo Tech) OME2019-37
Molecular transistors have been studied for 50 years, however electrical contacts to a single-molecule have been the iss... [more] OME2019-37
pp.9-12
ED, SDM 2018-02-28
10:00
Hokkaido Centennial Hall, Hokkaido Univ. Electrical Characteristics of Single-Electron Transistor Made of Fe-MgF2 Single-Layer Granular Thin Films
Yuki Asai, Shusaku Honjo, Takayuki Gyakushi, Atsushi Tsurumaki-Fukuchi, Masashi Arita, Yasuo Takahashi (Hokkaido Univ.) ED2017-104 SDM2017-104
Single-electron transistor (SET) is the expected future integrated device with very low power consumption in operation a... [more] ED2017-104 SDM2017-104
pp.1-6
SDM, ED 2015-02-06
11:05
Hokkaido Hokkaido Univ. Fabrication and characterization of graphene single carrier transistor
Takuya Iwasaki, Manoharan Muruganathan, Hiroshi Mizuta (JAIST) ED2014-150 SDM2014-159
In this work, we study the fabrication and the characterization of the graphene Single Carrier Transistor (SCT) with sin... [more] ED2014-150 SDM2014-159
pp.69-73
ED, SDM 2014-02-28
12:05
Hokkaido Hokkaido Univ. Centennial Hall Formation Scheme of Nano-Scale Devices Based on Ni Nanogaps Using Field-Emission-Induced Electromigration
Ryutaro Suda, Mitsuki Ito, Kohei Morihara, Takahiro Toyonaka, Kazuki Takikawa, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2013-149 SDM2013-164
We propose a simple and easy fabrication scheme of ferromagnetic single-electron transistors (FMSETs), nanogap based res... [more] ED2013-149 SDM2013-164
pp.95-100
SDM, ED 2013-02-28
09:00
Hokkaido Hokkaido Univ. Integration of CMOS 1-bit Analog Selector and Single-Electron Transistors Operating at Room Temperature
Ryota Suzuki, Motoki Nozue, Takuya Saraya, Toshiro Hiramoto (Univ. of Tokyo) ED2012-137 SDM2012-166
In this paper, integrated circuit operation of CMOS analog selector circuits and silicon single-electron transistors is ... [more] ED2012-137 SDM2012-166
pp.47-52
ED, SDM 2012-02-08
09:55
Hokkaido   Simultaneous Control of Series-Connected Nanogaps by Field-Emission-Induced Electromigration
Mitsuki Ito, Shunsuke Akimoto, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2011-151 SDM2011-168
We present a simple and easy technique for the simultaneous control of electrical properties of multiple Ni nanogaps. Th... [more] ED2011-151 SDM2011-168
pp.53-58
SDM, ED 2011-02-24
11:10
Hokkaido Hokkaido Univ. Current Intermittency in SOI-FETs under Light Illumination
Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-204 SDM2010-239
We investigate the effects of continuous light illumination on single-electron transport via quantum dots in silicon-on-... [more] ED2010-204 SDM2010-239
pp.67-72
ED, SDM 2010-02-22
15:40
Okinawa Okinawaken-Seinen-Kaikan Integration of Single-Electron Transistors Using Field-Emission-Induced Electromigration
Shunsuke Ueno, Yusuke Tomoda, Watari Kume, Michinobu Hanada, Kazutoshi Takiya, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2009-202 SDM2009-199
We report a novel technique for the integration of planer-type single-electron transistors (SETs) based on nanogaps usin... [more] ED2009-202 SDM2009-199
pp.35-39
ED 2009-04-24
09:25
Miyagi Tohoku Univ. Fabrication of a Room-temperature Operation Single Electron Transistor through Anodization Process
Yasuo Kimura, Takami Muto, Michio Niwano (Tohoku Univ.) ED2009-9
In order to fabricate single-electron transistors which can operate at room temperature, it is necessary to arrange a se... [more] ED2009-9
pp.35-38
SDM, ED 2009-02-27
09:00
Hokkaido Hokkaido Univ. Fabrication of single-Electron Transistors Using Field-Emission-Induced Electromigration
Yusuke Tomoda, Watari Kume, Michinobu Hanada, Keisuke Takahashi, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2008-232 SDM2008-224
We report a simple and easy technique for the fabrication of single-electron transistors (SETs) consisted of nanogaps wi... [more] ED2008-232 SDM2008-224
pp.47-52
ED, SDM 2008-01-31
09:25
Hokkaido   Approaches to the high temperature operation of the carbon nanotube single electron transistor
Takahiro Mori (RIKEN), Shunsuke Sato, Kazuo Omura, Katsumi Uchida, Hirofumi Yajima (TUS), Koji Ishibashi (RIKEN) ED2007-245 SDM2007-256
Single-walled carbon nanotubes (SWNTs) are promising candidates for the building block of the single electron transistor... [more] ED2007-245 SDM2007-256
pp.43-46
CPM 2007-08-09
14:30
Yamagata Yamagata Univ. [Invited Talk] Room-temperature observation of Coulomb staircases in aluminum nanodots formed by anodization
Yasuo Kimura, Michio Niwano (Tohoku Univ.) CPM2007-39
It is necessary to develop a hybrid technique of bottom-up and top-down processes for fabrication of room-temperature op... [more] CPM2007-39
pp.15-19
SDM, ED 2007-02-02
13:00
Hokkaido   Cotunneling Current in Si Single-electron Transistor Based on Multiple Islands
Kensaku Ohkura, Tetsuya Kitade, Anri Nakajima (Hiroshima Univ.)
Single-electron transistors (SETs) are promising candidates for use as basic elements of future low-power integrated cir... [more] ED2006-254 SDM2006-242
pp.79-82
ED, SDM 2006-01-26
13:55
Hokkaido Hokkaido Univ. Periodic Coulomb oscillation in Si single-eletron transistor based on multiple islands
Kensaku Ohkura (Hiroshima Univ.), Tetsuya Kitade (ROHM), Anri Nakajima (Hiroshima Univ.)
Single-electron transistors (SETs) utilizing the Coulomb blockade effect are promising candidates for use as basic eleme... [more] ED2005-225 SDM2005-237
pp.7-11
ED, SDM 2006-01-26
14:45
Hokkaido Hokkaido Univ. Room-temperature operation of an exclusive-OR circuit using a highly doped Si single-electron transistor
Kensaku Ohkura (Hiroshima Univ.), Tetsuya Kitade (ROHM), Anri Nakajima (Hiroshima Univ.)
Single-electron transistors (SETs) utilizing the Coulomb blockade effect are promising candidates for use as basic eleme... [more] ED2005-227 SDM2005-239
pp.19-22
ED, SDM 2006-01-27
10:30
Hokkaido Hokkaido Univ. Study on switching characteristics of quantum wire transistors and single electron transistors controlled by Schottky wrap gate for ultra-low power quantum nano integrated logic circuits
Seiya Kasai, Miki Yumoto, Hideki Hasegawa (Hokkaido Univ.)
To confirm the ultra-low power consumption capability of quantum nano integrated logic circuits, such as nanoprocessors,... [more] ED2005-234 SDM2005-246
pp.15-20
 Results 1 - 16 of 16  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan