Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
KBSE |
2021-03-06 14:25 |
Online |
Online |
KBSE2020-46 |
In recent years, the use of open source software (OSS) in product software has been increasing in the industrial world, ... [more] |
KBSE2020-46 pp.71-76 |
EA, US, SP, SIP, IPSJ-SLP [detail] |
2021-03-03 14:05 |
Online |
Online |
[Poster Presentation]
Comparison of speech intelligibility results between laboratory and crowd-sourcing experiments Ayako Yamamoto, Toshio Irino (Wakayama Univ.), Kenichi Arai, Shoko Araki, Atunori Ogawa, Keisuke Kinoshita, Tomohiro Nakatani (NTT) EA2020-73 SIP2020-104 SP2020-38 |
Many subjective experiments have been performed to develop objective speech intelligibility measure. But COVID-19 has ma... [more] |
EA2020-73 SIP2020-104 SP2020-38 pp.79-84 |
EMD, R |
2021-02-12 13:35 |
Online |
Online |
Photograph observation of 12 parallel discharge arcs generated in the atmosphere by a reliable trigger gap switch Tomokatsu Aizawa (Tokyo Metropolitan College) R2020-34 EMD2020-25 |
This trigger gap switch has a switching circuit that combines multiple main electrodes and induced electric field genera... [more] |
R2020-34 EMD2020-25 pp.1-6 |
EMD, R |
2021-02-12 15:00 |
Online |
Online |
[Invited Talk]
Reliability physics issues for electronic devices
-- Failure mechanisms that still need to be physically clarified -- Yasushi Kadota (RICOH Co.,Ltd.) R2020-37 EMD2020-28 |
Many kind of electronic devices, including semiconductor devices, have been using in various fields and applications in ... [more] |
R2020-37 EMD2020-28 pp.19-24 |
SDM |
2021-01-28 13:05 |
Online |
Online |
[Invited Talk]
**** Reika Ichihara (Kioxia) SDM2020-49 |
It has been known that charge trapping (Qt) reduces the effect of spontaneous polarization (Ps) in HfO2 based FeFET. Rec... [more] |
SDM2020-49 pp.1-2 |
HCS |
2021-01-24 11:10 |
Online |
Online |
The Relationship between Twitter Usage and Satisfaction of Friendship among University Students
-- Focus on Use of Multiple Accounts -- Takumi Soeda, Shaoyu Ye (Tsukuba Univ.) HCS2020-58 |
(To be available after the conference date) [more] |
HCS2020-58 pp.33-38 |
CQ (2nd) |
2021-01-21 10:50 |
Online |
Online |
[Invited Lecture]
Communication Based on Trustworthiness in Digital Society Motoshi Horii (Fujitsu Lab.) |
“Communication” does not only refer to data transmission among machines. With the widespread of smart devices and social... [more] |
|
R |
2020-12-11 14:50 |
Online |
Online |
Long-term Software Fault Prediction with Wavelet Shrinkage Estimation Jingchi Wu Hu, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2020-32 |
Recently, wavelet shrinkage estimation received considerable attentions to estimate stochastic processes such as a non-h... [more] |
R2020-32 pp.12-17 |
IT |
2020-12-02 13:00 |
Online |
Online |
Error exponent of probability that optimal strategy will fail under cost and profit constraints Kiminori Iriyama IT2020-36 |
In information theory, it is interesting to study the exponential rate when the error probability exponentially converge... [more] |
IT2020-36 pp.67-72 |
NS, ICM, CQ, NV (Joint) |
2020-11-26 09:30 |
Online |
Online |
A Study on Path Reachability Including Distance-Constrained Detours Miyu Otani, Takanori Hara, Masahiro Sasabe, Shoji Kasahara (NAIST) CQ2020-49 |
When links and/or nodes are down in a network, the network may not function normally. Most of the existing work focuses ... [more] |
CQ2020-49 pp.10-15 |
SDM |
2020-11-20 10:30 |
Online |
Online |
[Invited Talk]
Power Device Degradation Estimation by Machine Learning of Gate Waveforms Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) SDM2020-29 |
A method to detect bonding wire lift-off of SiC MOSFETs using machine learning from the gate voltage waveform is propose... [more] |
SDM2020-29 pp.32-35 |
COMP, IPSJ-AL |
2020-09-02 10:00 |
Online |
Online |
Procedure to Receive Linguistic Information
-- To construct Common Human Intelligence -- Kumon Tokumaru (Writer) COMP2020-7 |
Humans are eusocial animal. Language is a communication tool inside community and a tool to generate and develop collect... [more] |
COMP2020-7 pp.9-16 |
CQ |
2020-07-17 14:15 |
Online |
Online |
High Reliability Network Design Problem Considering Reduction Cost of Failure Probability of Simultaneous Failure Sets Yuma Morino, Hiroyoshi Miwa (Kwansei Gakuin Univ.) CQ2020-33 |
It is important to design a robust information network resistant to network failures. The protection method to decrease ... [more] |
CQ2020-33 pp.63-68 |
DE |
2020-06-27 10:05 |
Online |
Online |
A Recommendation Method of Health Article based on Association Rule for Health Terms Appeared on the Web Trinh Viet Thong, Takano Kosuke (KAIT) DE2020-4 |
This paper presents a recommendation method of health articles based on association rules for health terms appeared on W... [more] |
DE2020-4 pp.19-24 |
ISEC |
2020-05-20 15:30 |
Online |
Online |
An Anonymous Trust-Marking Scheme on NEM Blockchain Systems Tomoki Fujitani (Univ.Tsukuba/NICT), Keita Emura (NICT), Kazumasa Omote (Univ.Tsukuba/NICT) ISEC2020-11 |
In recent years, cryptocurrencies (crypto-assets) such as Bitcoin, Ethereum, and NEM have attracted attention in various... [more] |
ISEC2020-11 pp.47-54 |
EMD, R |
2020-02-14 13:35 |
Shizuoka |
|
Trend on standardization of Dependability
-- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54 |
IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China... [more] |
R2019-54 EMD2019-54 pp.1-6 |
SDM |
2020-01-28 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Formation of High Reliability Hydrogen-free MONOS Cells Using Deuterated Ammonia Masaki Noguchi, Tatsunori Isogai, Hiroyuki Yamashita, Keiichi Sawa, Ryota Fujitsuka, Takanori Yamanaka, Shunsuke Okada, Tomonori Aoyama, Fumiki Aiso, Junko Abe, Yoshiro Ogawa, Seiji Nakagawa, Hideshi Miyajima (KIOXIA) SDM2019-82 |
For high reliability non-volatile memory cell dielectrics, hydrogen-free deuterated tunnel SiON and charge-trap SiN film... [more] |
SDM2019-82 pp.1-4 |
HCS |
2020-01-26 09:50 |
Oita |
Room407, J:COM HorutoHall OITA (Oita) |
The Relationships between Psychological Well-being and Twitter Use among University Students Hiro Inoue, Shaoyu Ye (Univ. of Tsukuba) HCS2019-68 |
In this study, we examined the general social credibility of (1) whether social networks obtained through Twitter and fa... [more] |
HCS2019-68 pp.83-88 |
DC |
2019-12-20 16:30 |
Wakayama |
|
Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] |
DC2019-85 pp.37-42 |
R |
2019-12-13 15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Lindley Type Distributions and Software Reliability Assessment Qi Xiao, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2019-53 |
Dennis Victor Lindley proposed an interesting one-parameter continuous probability distribition, which is called Lindley... [more] |
R2019-53 pp.19-24 |