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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2023-09-28 14:20 |
Fukuoka | (Primary: On-site, Secondary: Online) |
Copula models based on left-truncated and competing risks data
-- Likelihood inference based on field studies -- Takeshi Emura (ISM), Hirofumi Michimae (Kitasato Univ.)  R2023-39 |
In the collection method of failure data (field life data) in field tests, unobserved failure occurs before the collecti... [more] | R2023-39 pp.12-15 |
| CPSY, DC, IPSJ-ARC [detail] | 2023-08-03 09:00 |
Hokkaido | Hakodate Arena (Primary: On-site, Secondary: Online) |
Proposal of Data Protection Features using Peak Shift Method of Drive Failure Risk Takaki Nakamura (Tohoku Univ.), Hitoshi Kamei (Kagawa Univ.) CPSY2023-8 DC2023-8 |
We propose a peak shift method for data protection that considers time-series changes in drive failure risk and the risk... [more] | CPSY2023-8 DC2023-8 pp.1-6 |
| R | 2021-10-22 14:25 |
Online | Online | [Invited Talk]
Field Lifetime Data Analysis with Left-truncation and Right-censoring
-- Statistical Inference and Reliability Prediction based on Parametric Models -- Takeshi Emura (Kurume Univ.), Hirofumi Michimae (Kitasato Univ.) R2021-31 |
In applications of reliability analyses, a dataset may be collected during a period of time to observe failure events. L... [more] | R2021-31 pp.7-12 |
| R | 2016-11-17 14:00 |
Osaka | Osaka Central Electric Club Bldg. | Estimation of three parameters of Weibull distribution by a discretization mdel Kenji Uogishi R2016-49 |
It is divided in fixed period of time such as days or months and the statistics information that the observation numeric... [more] | R2016-49 pp.1-6 |
| R | 2016-11-17 14:25 |
Osaka | Osaka Central Electric Club Bldg. | Software Reliability Analysis Based on Machine Learning Toru Kaise (Univ. of Hyogo) R2016-50 |
Software debugging processes are made to be effective by managing methods with reliability evaluations. The reliability ... [more] | R2016-50 pp.7-11 |
| R | 2012-05-25 15:45 |
Shimane | On the Role of Weibull-type Distributions in Binomial Software Reliability Modeling Xiao Xiao, Tadashi Dohi (Hiroshima Univ.) R2012-7 |
The binomial software reliability model (SRM) is one of the most classical but plausible SRMs, and can describe many sof... [more] | R2012-7 pp.35-40 |
|
| EMD, R | 2011-02-18 15:50 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Statistical Quality Control based on Early Life Failure Rate for Electronic Components Toshinari Matsuoka (MELCO) R2010-48 EMD2010-149 |
Basically, a manufacturing process of electronic components is complex and demanding.Therefore, in order to achieve a qu... [more] | R2010-48 EMD2010-149 pp.37-42 |
| R | 2009-07-31 16:00 |
Hokkaido | A Study of Estimation for the Three-ParameterWeibull Distribution under Singly Censored Data Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.), Tsunenori Ishioka (NCUEE), Hisashi Yamamoto (Tokyo Metropolitan Univ.) R2009-30 |
Efficient methods for parameter estimation of the three-parameter Weibull distribution under censored data have not exis... [more] | R2009-30 pp.47-51 |
|
| EMD | 2009-07-17 15:20 |
Hokkaido | Chitose Arcadia Plaza | An experimental study on analysis of contact resistance data with Weibull distribution function Makoto Hasegawa (Chitose Inst. of Sci. and Tech.) EMD2009-25 |
In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to c... [more] | EMD2009-25 pp.25-30 |
| R | 2008-06-20 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A consideration on estimation of the Weibull parameters Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.) R2008-16 |
Two methods for parameter estimation of the three-parameter Weibull distribution are proposed. In the both methods, the ... [more] | R2008-16 pp.9-14 |
| R, SSS | 2006-12-15 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Parameter estimation for lifetime distributions free from location information Hideki Nagatsuka (Tokyo Metropolitan Univ.) |
Weibull distribution and gamma distribution, having location (threshold), scale and shape parameters, are used as models... [more] | R2006-43 SSS2006-24 pp.25-30 |
| R | 2006-05-26 13:25 |
Tokushima | University of Tokushima | Software Reliability Modeling Based on A Discrete Weibull-Type Failure-Occurrence Times Distribution Shinji Inoue, Shigeru Yamada (Tottori Univ.) |
Unified modeling frameworks for software reliability growth models (SRGM's) are known as the frameworks for treating exi... [more] | R2006-8 pp.7-12 |
| OPE, R, CPM | 2005-04-22 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fatigue characteristics of the Si moveable comb inserted into MEMS optical devices Takayuki Shimazu, Makoto Katayama (SEI), Yoshitada Isono (Rits) |
This paper focuses on the fatigue characteristics of the single crystal silicon (SC-Si) cantilever in relation with the ... [more] | R2005-6 CPM2005-6 OPE2005-6 pp.29-32 |
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