|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 15:00 |
Ehime |
Ehime Prefecture Gender Equality Center |
On-Chip Leakage Monitor based Temperature Sensor Circuit for Ultra Low Voltage Daisuke Sato, Kimiyoshi Usami (SIT) VLD2019-33 DC2019-57 |
The increase in leakage current due to miniaturization is a big problem in devices that require low power consumption. L... [more] |
VLD2019-33 DC2019-57 pp.45-50 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-02 16:20 |
Nagasaki |
Nagasaki Kinro Fukushi Kaikan |
Sleep Control Using Virtual Ground Voltage Detection For Fine-Grain Power Gating Masaru Kudo, Kimiyoshi Usami (Shibaura Institute of Tech.) VLD2015-57 DC2015-53 |
This paper describes a sleep control technique using leakage monitor circuit to implement Fine-Grain Power Gating (FGPG)... [more] |
VLD2015-57 DC2015-53 pp.129-134 |
RECONF, CPSY, VLD, IPSJ-SLDM [detail] |
2015-01-29 17:00 |
Kanagawa |
Hiyoshi Campus, Keio University |
Temperature sensor applying Body Bias in Silicon-on-Thin-BOX Tsubasa Kosaka, Shohei Nakamura, Kimiyoshi Usami (S.I.T.) VLD2014-127 CPSY2014-136 RECONF2014-60 |
The performance advancement by the transistor scaling is blocked by increase of power consumption and process variation.... [more] |
VLD2014-127 CPSY2014-136 RECONF2014-60 pp.99-104 |
VLD |
2014-03-05 13:00 |
Okinawa |
Okinawa Seinen Kaikan |
Investigation of thermal monitor for applying to Dynamic Voltage Scaling in SOTB Tatsuya Wada, Kimiyoshi Usami (Shibaura Inst. of Tech) VLD2013-160 |
SOTB (Silicon on Thin Buried Oxide) transistors can operate at high speed in the ultra-low voltage. However, variation i... [more] |
VLD2013-160 pp.141-146 |
CPSY, VLD, RECONF, IPSJ-SLDM [detail] |
2013-01-16 16:00 |
Kanagawa |
|
Break Even Time Evaluation of Run-Time Power Gating Control by On-chip Leakage Monitor Kensaku Matsunaga, Masaru Kudo (SIT), Yuya Ohta, Nao Konishi (SIT), Hideharu Amano (KU), Ryuichi Sakamoto, Mitaro Namiki (TUAT), Kimiyoshi Usami (SIT) VLD2012-118 CPSY2012-67 RECONF2012-72 |
Run-time Power Gating (RTPG) reduces leakage energy by turning off a power switch(PS) for idle periods of a circuit duri... [more] |
VLD2012-118 CPSY2012-67 RECONF2012-72 pp.63-68 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 13:50 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
Control of Fine-Grain Power Gating by Detecting of the Virtual Ground Voltage Masaru Kudo, Kimiyoshi Usami (Shibaura Institute of Tech.) VLD2012-98 DC2012-64 |
This paper describes fine-grain control to power gate function units using the charge up phenomenon of the virtual groun... [more] |
VLD2012-98 DC2012-64 pp.225-230 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|