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Paper #
ICD
,
CPM
2005-01-28
11:45
Tokyo
Kikai-Shinko-Kaikan Bldg.
On Observability Quantification for Fault Diagnosis of VLSI Circuits
Naoya Toyota
,
Seiji Kajihara
,
Xiaoqing Wen
(
KIT
),
Masaru Sanada
(
NEC Electoronics
)
In most fault diagnosis, logic values can be observed at primary outputs and scan flip-flops as observation points. Howe...
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CPM2004-167
ICD2004-212
pp.31-34
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