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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
RCC, ASN, RCS, NS, SR
(Joint)
2015-07-31
15:00
Nagano JA Naganoken Bldg. [Encouragement Talk] A study on the bug density properties and similarities in software development quality
Takashi Ozawa, Toru Takahashi (NTT) NS2015-65
Quality control in current software development, sets the index value in the defect density in order to bad software qua... [more] NS2015-65
pp.165-168
NS, IN
(Joint)
2015-03-02
11:20
Okinawa Okinawa Convention Center A study on the bug density properties and similarities in software development quality
Takashi Ozawa, Toru Takahashi (NTT) NS2014-202
Quality control in current software development, sets the index value in the defect density in order to bad software qua... [more] NS2014-202
pp.145-148
NS 2013-05-16
15:00
Kanagawa The Graduate Univ. for Advanced Studies A Method of Calculating the Bug-Density Index of Software Developed Repeatedly
Toshihiro Watari, Nobuyuki Matsuda (NTT) NS2013-19
When the software developed repeatedly is debugged, the bug-density will decrease along with the development editions, b... [more] NS2013-19
pp.45-49
SS 2010-03-08
15:20
Kagoshima Kagoshima Univ. Empirical Evaluation of Bug Density Prediction Model to Low Granularity Modules
Yasutaka Kamei, Shinsuke Matsumoto, Akito Monden, Ken-ichi Matsumoto (NAIST) SS2009-72
To clarify the effects of bug module prediction on integration test,this paper experimentally evaluates the performance ... [more] SS2009-72
pp.145-150
KBSE 2009-11-27
13:00
Shimane Shimane Univ. An analysis of relationship between software bug and variable name
Hiroyuki Yamamoto, Yasutaka Kamei, Shinsuke Matsumoto, Akito Monden, Ken-ichi Matsumoto (NAIST) KBSE2009-42
Variable names used in each software module could be used as indicators of software bugs in the module because (1) names... [more] KBSE2009-42
pp.67-71
SS 2008-10-17
09:20
Yamanashi University of Yamanashi, Kofu Campus An analysis of relationship between code clone length and software reliability
Hiroki Sato, Yasutaka Kamei, Hidetake Uwano, Akito Monden, Shinji Kawaguchi, Masataka Nagura, Ken-ichi Matsumoto, Hajimu Iida (NAIST) SS2008-34
A code clone that is duplicated code section in source files makes software maintenance more difficult. However, to our ... [more] SS2008-34
pp.43-48
 Results 1 - 6 of 6  /   
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