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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-02-26 14:10 |
Tokyo |
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A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92 |
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] |
DC2019-92 pp.37-42 |
DC |
2019-02-27 09:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73 |
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] |
DC2018-73 pp.13-18 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-28 10:05 |
Oita |
B-ConPlaza |
A Test Point Insertion Method to Reduce Capture Power Dissipation Yoshiyasu Takahashi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) VLD2014-99 DC2014-53 |
In at-speed scan testing of deep sub-micron era, high power dissipation can occur by high launch-induced switching activ... [more] |
VLD2014-99 DC2014-53 pp.185-190 |
VLD, ICD, DC, IPSJ-SLDM |
2005-12-02 09:30 |
Fukuoka |
Kitakyushu International Conference Center |
On Low Capture Power Test Generation for Scan Testing Tatsuya Suzuki, Xiaoqing Wen, Seiji Kajihara (K.I.T.), Kohei Miyase, Yoshihiro Minamoto (JST) |
High switching activity occurs when the response to a test vector is captured by flip-flops during scan testing. This ma... [more] |
VLD2005-76 ICD2005-171 DC2005-53 pp.1-6 |
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