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Date Time
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Abstract
Paper #
ICD
,
CPM
2005-01-28
14:00
Tokyo
Kikai-Shinko-Kaikan Bldg.
On Finding Don't Cares in Test Sequences for Sequential Circuits and Applications to Test Compaction and Power Reduction
Yoshinobu Higami
(
Ehime Univ.
),
Seiji Kajihara
(
Kyushu Inst. Tech.
),
Shin-ya Kobayashi
,
Yuzo Takamatsu
(
Ehime Univ.
)
This paper presents a method for finding don't cares in test sequences hile keeping the original stuck-at fault coverage...
[more]
CPM2004-169
ICD2004-214
pp.41-46
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