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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| IN, NS (Joint) |
2023-03-03 11:00 |
Okinawa | Okinawa Convention Centre + Online (Primary: On-site, Secondary: Online) |
Free Viewpoint Video Streaming for Reducing the Amount of Transferred Data in the Core Network by Separating and Transmitting Motion-Extracted Video and Re-Synthesizing Background Video Ryuta Murakami, Hikaru Yamaguchi, Saeko Maeda, Takashi Kurimoto, Satoru Okamoto, Naoaki Yamanaka (Keio Univ.)  NS2022-227 |
Virtual Reality (VR) contents are expected to be utilized in various fields such as education, medicine, and entertainme... [more] | NS2022-227 pp.345-350 |
| SeMI, SeMI (Joint) |
2023-01-19 17:25 |
Tokushima | Naruto grand hotel (Primary: On-site, Secondary: Online) |
[Short Paper]
An Empirical Study of Data Reduction Method for Point Cloud-based Millimeter-wave Link Quality Prediction Shoki Ohta, Takayuki Nishio (Tokyo Tech), Riichi Kudo, Kahoko Takahashi, Hisashi Nagata (NTT) SeMI2022-93 |
This study experimentally evaluates a tradeoff between prediction accuracy and the number of points on a millimeter-wave... [more] | SeMI2022-93 pp.96-100 |
| ASN, NS, RCS, SR, RCC (Joint) |
2018-07-13 16:15 |
Hokkaido | Hakodate Arena | Performance Evaluations of a Video Distribution Method balancing High Picture Quality and Bitrate Reduction Tatsuya Nagashima, Yusuke Sakamoto, Masaru Takeuchi, Kenji Kanai, Jiro Katto (Waseda Univ) NS2018-83 |
In this paper, to achieve high picture quality and bitrate reduction, we propose a video distribution method based on Ju... [more] | NS2018-83 pp.235-240 |
| DC | 2014-02-10 15:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Test Data Reduction Method for BIST-Aided Scan Test by Controlling Scan Shift and Partial Reset of Inverter Code Ryota Mori, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2013-88 |
BIST-aided scan test (BAST) has been proposed as one of the techniques that enhances scan-based BIST. The BAST architect... [more] | DC2013-88 pp.55-60 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 10:15 |
Miyazaki | NewWelCity Miyazaki | A BIST-Aided Scan Test using Shifting Inverter Code and a TPG Method for Test Data Reduction Yasuhiko Okada, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) VLD2011-74 DC2011-50 |
BIST-aided scan test (BAST) has been proposed as one of the techniques that enhance scan-based BIST.The BAST architectur... [more] | VLD2011-74 DC2011-50 pp.133-138 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-18 10:30 |
Fukuoka | Kitakyushu Science and Research Park | [Poster Presentation]
A Test Point Insertion Method for Test Data Reduction Based on Necessary Assignment Kazuko Hiramoto, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ) VLD2008-80 DC2008-48 |
In this work, we discuss a method for reducing test data by test point insertion. Focusing on the fact that test points ... [more] | VLD2008-80 DC2008-48 pp.121-126 |
| VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-20 10:05 |
Fukuoka | Kitakyushu International Conference Center | 2-Step Test Data Compression using Scan FF with Two Pattern Testability Kentaroh Katoh, Kazuteru Namba, Hideo Ito (Chiba Univ.) VLD2007-70 DC2007-25 |
This paper presents a stuck-at test data compression technique using the scan flip flops with delay fault testability. T... [more] | VLD2007-70 DC2007-25 pp.1-6 |
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