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ICD 2011-12-16
14:50		 Osaka   Multiple-Bit-Upset and Single-Bit-Upset Resilient 8T SRAM Bitcell Layout with Divided Wordline Structure
Yohei Umeki, Shusuke Yoshimoto, Takurou Amashita, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST) ICD2011-134		 This paper presents a new 8T (8-transistor) SRAM cell layout mitigating multiple-bit upset (MBU) in a divided wordline s... [more] ICD2011-134
pp.161-166
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