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Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, VLD [detail] 2020-03-06
13:00		 Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)		 Fundamental Study on Fault Analysis with Non-Uniform Faulty Values Caused at Fault Injection into Sequential Circuit
Takumi Okamoto, Daisuke Fujimoto (NAIST), Kazuo Sakiyama, Li Yang (UEC), Yu-ichi Hayashi (NAIST) VLD2019-128 HWS2019-101		 Fault analysis for the cryptographic module is roughly divided into two phases; those are injecting transient faults and... [more] VLD2019-128 HWS2019-101
pp.197-201
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