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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 15:20 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea |
A Test Register Assignment Method to Reduce the Number of Test Patterns at Register Transfer Level Using Controller Augmentation Shun Takeda, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ) VLD2017-37 DC2017-43 |
Recently, it is very important to reduce the number of test patterns by using design-for-testability (DFT) with the incr... [more] |
VLD2017-37 DC2017-43 pp.61-66 |
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