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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2014-11-28
09:40		 Oita B-ConPlaza A Test Generation Method for Low Capture Power Using Capture Safe Test Vectors
Atsushi Hirai, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai (Nihon Univ.) VLD2014-98 DC2014-52		 In at-speed scan testing, capture power is a serious problem because the high power dissipation that can occur when the ... [more] VLD2014-98 DC2014-52
pp.179-184
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