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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-04 14:25 |
Kochi |
Kochi City Culture-Plaza |
A Path Selection Method of Delay Test for Transistor Aging Mitsumasa Noda (Kyushu Institute of Tech.), Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Institute of Tech./JST), Yukiya Miura (Tokyo Metropolitan Univ./JST) VLD2009-65 DC2009-52 |
With the advanced VLSI process technology, it is important for reliability of VLSIs to deal with faults caused by aging.... [more] |
VLD2009-65 DC2009-52 pp.167-172 |
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