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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2010-11-11 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Latest Trends in Simulation and Characterization of Statistical CMOS Variability and Reliability
-- Review of 2010 SISPAD Workshop1 -- Shuichi Toriyama (Toshiba Corp.) SDM2010-172 |
A workshop entitled "Simulation and Characterization of Statistical CMOS Variability and Reliability" was held on Septem... [more] |
SDM2010-172 pp.5-10 |
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