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RECONF
2006-09-14
15:15
Kumamoto
Kumamoto Univ.
Discussion of Memory-LSI Working as Reconfigurable Device
Masanori Yoshihara
,
Tetsuo Hironaka
(
HCU
),
Masayuki Sato
(
GTI
)
Each function included in SoC are usually tested by the built in test circuits in the chip.Testing the SoC by the built ...
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RECONF2006-24
pp.23-28
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