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Committee Date Time Place Paper Title / Authors Abstract Paper #
OFT, OPE, OCS
(Joint) [detail]		 2013-03-01
14:00		 Tokyo   Electric field profile evaluation at waveguide facet by using reverse fourier transformation of far-field pattern
Hirohito Hokazono, Daisuke Nakashima, Jiao Chen, Miki Tsujino, Kiichi Hamamoto (Kyushu University) OCS2012-109 OFT2012-85 OPE2012-203		 NFP(Near-Field Pattern) and FFP(Far-Field Pattern) measurement are commonly used by evaluation method of ray field of th... [more] OCS2012-109 OFT2012-85 OPE2012-203
pp.65-70(OCS), pp.85-90(OFT), pp.85-90(OPE)
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