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Committee Date Time Place Paper Title / Authors Abstract Paper #
IT, ISEC, WBS 2012-03-01
10:30		 Kanagawa   A Clone Resistance Evaluation of Visible-Light Paper Artifact-Metrics
Yuki Kondo, Yasuhiro Takeuchi, Junji Shikata, Tsutomu Matsumoto (Yokohama National Univ.) IT2011-46 ISEC2011-73 WBS2011-47		 Visible-light paper artifact-metric system is a type of authentication system using visible light patterns of paper as i... [more] IT2011-46 ISEC2011-73 WBS2011-47
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