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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD 2015-08-24
09:30
Kumamoto Kumamoto City [Invited Talk] Highly Reliable TaOx ReRAM with Centralized Filament for 28-nm Embedded Application
Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, Satoru Fujii, Satoru Ito, Yoshio Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda (Panasonic) SDM2015-57 ICD2015-26
For 28-nm embedded application, we have proposed a TaOx-based ReRAM with precise filament positioning and high thermal s... [more] SDM2015-57 ICD2015-26
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