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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD 2013-08-02
10:25		 Ishikawa Kanazawa University 28nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique
Yukiko Umemoto, Koji Nii, Jiro Ishikawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Shinji Tanaka, Koji Tanaka, Kazutaka Mori, Kazumasa Yanagisawa (Renesas Electronics) SDM2013-77 ICD2013-59		 We propose a new 2T mask read only memory (ROM) with dynamic column source bias control technique, which enables achievi... [more] SDM2013-77 ICD2013-59
pp.59-64
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