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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2008-04-18 11:15 |
Tokyo |
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[Invited Talk]
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
-- Evolution of Multi-Node Upset Issues -- Eishi Ibe (PERL) ICD2008-10 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] |
ICD2008-10 pp.51-56 |
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